| dc.contributor.author | Arefeen, Yamin | |
| dc.contributor.author | Beker, Onur | |
| dc.contributor.author | Cho, Jaejin | |
| dc.contributor.author | Yu, Heng | |
| dc.contributor.author | Adalsteinsson, Elfar | |
| dc.contributor.author | Bilgic, Berkin | |
| dc.date.accessioned | 2022-02-16T18:00:23Z | |
| dc.date.available | 2022-02-16T18:00:23Z | |
| dc.date.issued | 2021-10-02 | |
| dc.identifier.issn | 0740-3194 | |
| dc.identifier.issn | 1522-2594 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/140427 | |
| dc.language | en | |
| dc.publisher | Wiley | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1002/mrm.29036 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | Wiley | en_US |
| dc.title | Scan‐specific artifact reduction in k‐space (SPARK) neural networks synergize with physics‐based reconstruction to accelerate MRI | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Arefeen, Yamin, Beker, Onur, Cho, Jaejin, Yu, Heng, Adalsteinsson, Elfar et al. 2021. "Scan‐specific artifact reduction in k‐space (SPARK) neural networks synergize with physics‐based reconstruction to accelerate MRI." Magnetic Resonance in Medicine, 87 (2). | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.contributor.department | Harvard University--MIT Division of Health Sciences and Technology | |
| dc.relation.journal | Magnetic Resonance in Medicine | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.date.submission | 2022-02-09T20:09:13Z | |
| mit.journal.volume | 87 | en_US |
| mit.journal.issue | 2 | en_US |
| mit.license | OPEN_ACCESS_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
