| dc.contributor.author | Ning, Shuai | |
| dc.contributor.author | Huberman, Samuel C. | |
| dc.contributor.author | Ding, Zhiwei | |
| dc.contributor.author | Nahm, Ho‐Hyun | |
| dc.contributor.author | Kim, Yong‐Hyun | |
| dc.contributor.author | Kim, Hyun‐Suk | |
| dc.contributor.author | Chen, Gang | |
| dc.contributor.author | Ross, Caroline A. | |
| dc.date.accessioned | 2022-02-22T19:26:36Z | |
| dc.date.available | 2022-02-22T19:26:36Z | |
| dc.date.issued | 2019-09-13 | |
| dc.identifier.issn | 0935-9648 | |
| dc.identifier.issn | 1521-4095 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/140585 | |
| dc.language | en | |
| dc.publisher | Wiley | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1002/adma.201903738 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | Wiley | en_US |
| dc.title | Anomalous Defect Dependence of Thermal Conductivity in Epitaxial WO 3 Thin Films | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Ning, Shuai, Huberman, Samuel C., Ding, Zhiwei, Nahm, Ho‐Hyun, Kim, Yong‐Hyun et al. 2019. "Anomalous Defect Dependence of Thermal Conductivity in Epitaxial WO 3 Thin Films." Advanced Materials, 31 (43). | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | |
| dc.relation.journal | Advanced Materials | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.date.submission | 2022-02-09T20:37:44Z | |
| mit.journal.volume | 31 | en_US |
| mit.journal.issue | 43 | en_US |
| mit.license | OPEN_ACCESS_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |