Show simple item record

dc.contributor.authorWang, Nan
dc.contributor.authorKanhere, Elgar
dc.contributor.authorTao, Kai
dc.contributor.authorHu, Liangxing
dc.contributor.authorWu, Jin
dc.contributor.authorMiao, Jianmin
dc.contributor.authorTriantafyllou, Michael S.
dc.date.accessioned2022-02-28T20:55:28Z
dc.date.available2022-02-28T20:19:22Z
dc.date.available2022-02-28T20:55:28Z
dc.date.issued2018-12
dc.date.submitted2018-07
dc.identifier.issn1040-0397
dc.identifier.issn1521-4109
dc.identifier.urihttps://hdl.handle.net/1721.1/140824.2
dc.languageen
dc.publisherWileyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1002/elan.201800532en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceWileyen_US
dc.titleInvestigation of a Thin‐Film Quasi‐Reference Electrode Fabricated by Combined Sputtering‐Evaporation Approachen_US
dc.typeArticleen_US
dc.identifier.citationWang, Nan, Kanhere, Elgar, Tao, Kai, Hu, Liangxing, Wu, Jin et al. 2018. "Investigation of a Thin‐Film Quasi‐Reference Electrode Fabricated by Combined Sputtering‐Evaporation Approach." Electroanalysis.en_US
dc.contributor.departmentSingapore-MIT Alliance in Research and Technology (SMART)
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.relation.journalElectroanalysisen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.date.submission2022-02-10T18:03:39Z
mit.journal.volume31en_US
mit.journal.issue3en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work Neededen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record

VersionItemDateSummary

*Selected version