Causes of Oceanic Crustal Thickness Oscillations Along a 74‐M Mid‐Atlantic Ridge Flow Line
Author(s)
Shinevar, William J.; Mark, Hannah F.; Clerc, Fiona; Codillo, Emmanuel A.; Gong, Jianhua; Olive, Jean‐Arthur; Brown, Stephanie M.; Smalls, Paris T.; Liao, Yang; Le Roux, Véronique; Behn, Mark D.; ... Show more Show less
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Metadata
Show full item recordDate issued
2019-12Department
Woods Hole Oceanographic Institution; Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary SciencesJournal
Geochemistry, Geophysics, Geosystems
Publisher
American Geophysical Union (AGU)
Citation
Shinevar, William J., Mark, Hannah F., Clerc, Fiona, Codillo, Emmanuel A., Gong, Jianhua et al. 2019. "Causes of Oceanic Crustal Thickness Oscillations Along a 74‐M Mid‐Atlantic Ridge Flow Line." Geochemistry, Geophysics, Geosystems, 20 (12).
Version: Author's final manuscript
ISSN
1525-2027
1525-2027