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Analytical Criteria for Designing Multiresonance Filters in Scattering Systems, with Application to Microwave Metasurfaces

dc.contributor.authorBenzaouia, Mohammed
dc.contributor.authorJoannopoulos, John D.
dc.contributor.authorJohnson, Steven G.
dc.contributor.authorKaralis, Aristeidis
dc.date.accessioned2022-03-16T12:41:59Z
dc.date.available2022-03-16T12:41:59Z
dc.date.issued2022-03-07
dc.identifier.issn2331-7019
dc.identifier.urihttps://hdl.handle.net/1721.1/141207
dc.publisherAmerican Physical Society (APS)en_US
dc.relation.isversionof10.1103/physrevapplied.17.034018en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMohammed Benzaouiaen_US
dc.subjectGeneral Physics and Astronomyen_US
dc.titleAnalytical Criteria for Designing Multiresonance Filters in Scattering Systems, with Application to Microwave Metasurfacesen_US
dc.typeArticleen_US
dc.identifier.citationBenzaouia, Mohammed, Joannopoulos, John D., Johnson, Steven G. and Karalis, Aristeidis. 2022. "Analytical Criteria for Designing Multiresonance Filters in Scattering Systems, with Application to Microwave Metasurfaces." Phys. Rev. Applied, 17 (3).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mathematics
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronics
dc.relation.journalPhys. Rev. Applieden_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.identifier.doi10.1103/PhysRevApplied.17.034018
dspace.date.submission2022-03-15T22:48:48Z
mit.journal.volume17en_US
mit.journal.issue3en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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