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dc.contributor.authorConrad, Janet
dc.contributor.authorHen, Or
dc.date.accessioned2022-04-21T15:39:35Z
dc.date.available2022-04-21T15:39:35Z
dc.date.issued2021
dc.identifier.urihttps://hdl.handle.net/1721.1/142009
dc.description.abstract<jats:title>Abstract</jats:title> <jats:p>Accurate knowledge of electron transport properties is vital to understanding the information provided by liquid argon time projection chambers (LArTPCs). Ionization electron drift-lifetime, local electric field distortions caused by positive ion accumulation, and electron diffusion can all significantly impact the measured signal waveforms. This paper presents a measurement of the effective longitudinal electron diffusion coefficient, D<jats:sub>L</jats:sub>, in MicroBooNE at the nominal electric field strength of 273.9 V/cm. Historically, this measurement has been made in LArTPC prototype detectors. This represents the first measurement in a large-scale (85 tonne active volume) LArTPC operating in a neutrino beam. This is the largest dataset ever used for this measurement. Using a sample of ∼70,000 through-going cosmic ray muon tracks tagged with MicroBooNE's cosmic ray tagger system, we measure D<jats:sub>L</jats:sub> = 3.74<jats:sup>+0.28</jats:sup> <jats:sub>-0.29</jats:sub> cm<jats:sup>2</jats:sup>/s.</jats:p>en_US
dc.language.isoen
dc.publisherIOP Publishingen_US
dc.relation.isversionof10.1088/1748-0221/16/09/P09025en_US
dc.rightsCreative Commons Attribution 4.0 International licenseen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceIOP Publishingen_US
dc.titleMeasurement of the longitudinal diffusion of ionization electrons in the MicroBooNE detectoren_US
dc.typeArticleen_US
dc.identifier.citationConrad, Janet and Hen, Or. 2021. "Measurement of the longitudinal diffusion of ionization electrons in the MicroBooNE detector." Journal of Instrumentation, 16 (09).
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Science
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics
dc.relation.journalJournal of Instrumentationen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-04-21T15:32:55Z
dspace.orderedauthorsAbratenko, P; An, R; Anthony, J; Asaadi, J; Ashkenazi, A; Balasubramanian, S; Baller, B; Barnes, C; Barr, G; Basque, V; Bathe-Peters, L; Benevides Rodrigues, O; Berkman, S; Bhanderi, A; Bhat, A; Bishai, M; Blake, A; Bolton, T; Camilleri, L; Caratelli, D; Caro Terrazas, I; Castillo Fernandez, R; Cavanna, F; Cerati, G; Chen, Y; Church, E; Cianci, D; Conrad, JM; Convery, M; Cooper-Troendle, L; Crespo-Anadón, JI; Del Tutto, M; Dennis, SR; Devitt, D; Diurba, R; Dorrill, R; Duffy, K; Dytman, S; Eberly, B; Ereditato, A; Evans, JJ; Fine, R; Fiorentini Aguirre, GA; Fitzpatrick, RS; Fleming, BT; Foppiani, N; Franco, D; Furmanski, AP; Garcia-Gamez, D; Gardiner, S; Ge, G; Gollapinni, S; Goodwin, O; Gramellini, E; Green, P; Greenlee, H; Gu, W; Guenette, R; Guzowski, P; Hagaman, L; Hall, E; Hamilton, P; Hen, O; Horton-Smith, GA; Hourlier, A; Itay, R; James, C; Ji, X; Jiang, L; Jo, JH; Johnson, RA; Jwa, Y-J; Kamp, N; Kaneshige, N; Karagiorgi, G; Ketchum, W; Kirby, M; Kobilarcik, T; Kreslo, I; LaZur, R; Lepetic, I; Li, K; Li, Y; Lin, K; Lister, A; Littlejohn, BR; Louis, WC; Luo, X; Manivannan, K; Mariani, C; Marsden, D; Marshall, J; Martinez Caicedo, DA; Mason, K; Mastbaum, A; McConkey, N; Meddage, V; Mettler, T; Miller, K; Mills, J; Mistry, K; Mogan, A; Mohayai, T; Moon, J; Mooney, M; Moor, AF; Moore, CD; Mora Lepin, L; Mousseau, J; Murphy, M; Naples, D; Navrer-Agasson, A; Neely, RK; Nowak, J; Nunes, M; Palamara, O; Paolone, V; Papadopoulou, A; Papavassiliou, V; Pate, SF; Paudel, A; Pavlovic, Z; Piasetzky, E; Ponce-Pinto, ID; Prince, S; Qian, X; Raaf, JL; Radeka, V; Rafique, A; Reggiani-Guzzo, M; Ren, L; Rice, LCJ; Rochester, L; Rodriguez Rondon, J; Rogers, HE; Rosenberg, M; Ross-Lonergan, M; Scanavini, G; Schmitz, DW; Schukraft, A; Seligman, W; Shaevitz, MH; Sharankova, R; Sinclair, J; Smith, A; Snider, EL; Soderberg, M; Söldner-Rembold, S; Spentzouris, P; Spitz, J; Stancari, M; St John, J; Strauss, T; Sutton, K; Sword-Fehlberg, S; Szelc, AM; Tagg, N; Tang, W; Terao, K; Thorpe, C; Totani, D; Toups, M; Tsai, Y-T; Uchida, MA; Usher, T; Van De Pontseele, W; Viren, B; Weber, M; Wei, H; Williams, Z; Wolbers, S; Wongjirad, T; Wospakrik, M; Wright, N; Wu, W; Yandel, E; Yang, T; Yarbrough, G; Yates, LE; Zeller, GP; Zennamo, J; Zhang, Cen_US
dspace.date.submission2022-04-21T15:32:57Z
mit.journal.volume16en_US
mit.journal.issue09en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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