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dc.contributor.authorWulfmeier, Hendrik
dc.contributor.authorKohlmann, Dhyan
dc.contributor.authorDefferriere, Thomas
dc.contributor.authorSteiner, Carsten
dc.contributor.authorMoos, Ralf
dc.contributor.authorTuller, Harry L.
dc.contributor.authorFritze, Holger
dc.date.accessioned2022-07-13T20:16:56Z
dc.date.available2022-05-17T15:11:39Z
dc.date.available2022-07-13T20:16:56Z
dc.date.issued2021-11
dc.date.submitted2021-09
dc.identifier.issn0942-9352
dc.identifier.issn2196-7156
dc.identifier.urihttps://hdl.handle.net/1721.1/142566.2
dc.description.abstract<jats:title>Abstract</jats:title> <jats:p>The chemical expansion of Pr<jats:sub>0.1</jats:sub>Ce<jats:sub>0.9</jats:sub>O<jats:sub>2–<jats:italic>δ</jats:italic> </jats:sub> (PCO) and CeO<jats:sub>2–<jats:italic>δ</jats:italic> </jats:sub> thin films is investigated in the temperature range between 600 °C and 800 °C by laser Doppler vibrometry (LDV). It enables non-contact determination of nanometer scale changes in film thickness at high temperatures. The present study is the first systematic and detailed investigation of chemical expansion of doped and undoped ceria thin films at temperatures above 650 °C. The thin films were deposited on yttria stabilized zirconia substrates (YSZ), operated as an electrochemical oxygen pump, to periodically adjust the oxygen activity in the films, leading to reversible expansion and contraction of the film. This further leads to stresses in the underlying YSZ substrates, accompanied by bending of the overall devices. Film thickness changes and sample bending are found to reach up to 10 and several hundred nanometers, respectively, at excitation frequencies from 0.1 to 10 Hz and applied voltages from 0–0.75 V for PCO and 0–1 V for ceria. At low frequencies, equilibrium conditions are approached. As a consequence maximum thin-film expansion of PCO is expected due to full reduction of the Pr ions. The lower detection limit for displacements is found to be in the subnanometer range. At 800 °C and an excitation frequency of 1 Hz, the LDV shows a remarkable resolution of 0.3 nm which allows, for example, the characterization of materials with small levels of expansion, such as undoped ceria at high oxygen partial pressure. As the correlation between film expansion and sample bending is obtained through this study, a dimensional change of a free body consisting of the same material can be calculated using the high resolution characteristics of this system. A minimum detectable dimensional change of 5 pm is estimated even under challenging high-temperature conditions at 800 °C opening up opportunities to investigate electro-chemo-mechanical phenomena heretofore impossible to investigate. The expansion data are correlated with previous results on the oxygen nonstoichiometry of PCO thin films, and a defect model for bulk ceria solid solutions is adopted to calculate the cation and anion radii changes in the constrained films during chemical expansion. The constrained films exhibit anisotropic volume expansion with displacements perpendicular to the substrate plane nearly double that of bulk samples. The PCO films used here generate high total displacements of several 100 nm’s with high reproducibility. Consequently, PCO films are identified to be a potential core component of high-temperature actuators. They benefit not only from high displacements at temperatures where most piezoelectric materials no longer operate while exhibiting, low voltage operation and low energy consumption.</jats:p>en_US
dc.language.isoen
dc.publisherWalter de Gruyter GmbHen_US
dc.relation.isversionofhttp://dx.doi.org/10.1515/zpch-2021-3125en_US
dc.rightsCreative Commons Attribution 4.0 International Licenseen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0en_US
dc.sourcede Gruyteren_US
dc.titleThin-film chemical expansion of ceria based solid solutions: laser vibrometry studyen_US
dc.typeArticleen_US
dc.identifier.citationWulfmeier, Hendrik, Kohlmann, Dhyan, Defferriere, Thomas, Steiner, Carsten, Moos, Ralf et al. 2021. "Thin-film chemical expansion of ceria based solid solutions: laser vibrometry study." Zeitschrift für Physikalische Chemie, 0 (0).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.relation.journalZeitschrift für Physikalische Chemieen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-05-17T14:28:25Z
dspace.orderedauthorsWulfmeier, H; Kohlmann, D; Defferriere, T; Steiner, C; Moos, R; Tuller, HL; Fritze, Hen_US
dspace.date.submission2022-05-17T14:28:28Z
mit.journal.volume236en_US
mit.journal.issue6-8en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work Neededen_US


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