| dc.contributor.author | Wang, Christine Y | |
| dc.contributor.author | Peard, Nolan | |
| dc.contributor.author | Callahan, Dennis | |
| dc.contributor.author | Perkinson, Joy | |
| dc.contributor.author | Patel, Neil | |
| dc.contributor.author | LeBlanc, John | |
| dc.contributor.author | Du, Qingyang | |
| dc.contributor.author | Fakhrul, Takian | |
| dc.contributor.author | Ross, Caroline A | |
| dc.contributor.author | Hu, Juejun | |
| dc.date.accessioned | 2022-05-18T16:54:53Z | |
| dc.date.available | 2022-05-18T16:54:53Z | |
| dc.date.issued | 2020 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/142590 | |
| dc.language.iso | en | |
| dc.publisher | SPIE-Intl Soc Optical Eng | en_US |
| dc.relation.isversionof | 10.1117/12.2570591 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | SPIE | en_US |
| dc.title | Tunable infrared spectral imaging system | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Wang, Christine Y, Peard, Nolan, Callahan, Dennis, Perkinson, Joy, Patel, Neil et al. 2020. "Tunable infrared spectral imaging system." Electro-Optical and Infrared Systems: Technology and Applications XVII. | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
| dc.relation.journal | Electro-Optical and Infrared Systems: Technology and Applications XVII | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2022-05-18T16:50:05Z | |
| dspace.orderedauthors | Wang, CY; Peard, N; Callahan, D; Perkinson, J; Patel, N; LeBlanc, J; Du, Q; Fakhrul, T; Ross, CA; Hu, J | en_US |
| dspace.date.submission | 2022-05-18T16:50:07Z | |
| mit.license | PUBLISHER_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |