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dc.contributor.authorTan, Shu Fen
dc.contributor.authorReidy, Kate
dc.contributor.authorKlein, Julian
dc.contributor.authorPinkowitz, Ainsley
dc.contributor.authorWang, Baoming
dc.contributor.authorRoss, Frances M
dc.date.accessioned2022-05-18T18:25:35Z
dc.date.available2022-05-18T18:25:35Z
dc.date.issued2021
dc.identifier.urihttps://hdl.handle.net/1721.1/142597
dc.description.abstract<p>The combination of electrochemical analysis, temperature control and <italic>in situ</italic> TEM imaging directly probes the etching of Ni from bimetallic Ni–Pt nanoparticles.</p>en_US
dc.language.isoen
dc.publisherRoyal Society of Chemistry (RSC)en_US
dc.relation.isversionof10.1039/D0SC06057Gen_US
dc.rightsCreative Commons Attribution 3.0en_US
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/en_US
dc.sourceRoyal Society of Chemistryen_US
dc.titleReal-Time Imaging of Nanoscale Electrochemical Ni Etching under Thermal Conditionsen_US
dc.typeArticleen_US
dc.identifier.citationTan, Shu Fen, Reidy, Kate, Klein, Julian, Pinkowitz, Ainsley, Wang, Baoming et al. 2021. "Real-Time Imaging of Nanoscale Electrochemical Ni Etching under Thermal Conditions." Chemical Science, 12 (14).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.relation.journalChemical Scienceen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-05-18T18:22:45Z
dspace.orderedauthorsTan, SF; Reidy, K; Klein, J; Pinkowitz, A; Wang, B; Ross, FMen_US
dspace.date.submission2022-05-18T18:22:47Z
mit.journal.volume12en_US
mit.journal.issue14en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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