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dc.contributor.authorPang, Edward L
dc.contributor.authorSchuh, Christopher A
dc.date.accessioned2022-05-19T14:25:17Z
dc.date.available2022-05-19T14:25:17Z
dc.date.issued2021
dc.identifier.urihttps://hdl.handle.net/1721.1/142604
dc.description.abstract<jats:p>Accurately indexing pseudosymmetric materials has long proven challenging for electron backscatter diffraction. The recent emergence of intensity-based indexing approaches promises an enhanced ability to resolve pseudosymmetry compared with traditional Hough-based indexing approaches. However, little work has been done to understand the effects of sample position and orientation on the ability to resolve pseudosymmetry, especially for intensity-based indexing approaches. Thus, in this work the effects of crystal orientation and detector distance in a model tetragonal ZrO<jats:sub>2</jats:sub> (<jats:italic>c</jats:italic>/<jats:italic>a</jats:italic> = 1.0185) material are quantitatively investigated. The orientations that are easiest and most difficult to correctly index are identified, the effect of detector distance on indexing confidence is characterized, and these trends are analyzed on the basis of the appearance of specific zone axes in the diffraction patterns. The findings also point to the clear benefit of shorter detector distances for resolving pseudosymmetry using intensity-based indexing approaches.</jats:p>en_US
dc.language.isoen
dc.publisherInternational Union of Crystallography (IUCr)en_US
dc.relation.isversionof10.1107/S1600576721001229en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceJournal of Applied Crystallographyen_US
dc.titleCrystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffractionen_US
dc.typeArticleen_US
dc.identifier.citationPang, Edward L and Schuh, Christopher A. 2021. "Crystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffraction." Journal of Applied Crystallography, 54 (2).
dc.relation.journalJournal of Applied Crystallographyen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-05-19T12:58:50Z
dspace.orderedauthorsPang, EL; Schuh, CAen_US
dspace.date.submission2022-05-19T12:58:53Z
mit.journal.volume54en_US
mit.journal.issue2en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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