Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge<sub>2</sub>Sb<sub>2</sub>Se<sub>5</sub> thin films

Author(s)
Obeng, Yaw S; Nguyen, Nhan V; Amoah, Papa K; Ahn, Jungjoon; Shalaginov, Mikhail Y; ... Show more
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Date issued
2022-02-21
URI
https://hdl.handle.net/1721.1/142634
Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Journal
Journal of Applied Physics
Publisher
AIP Publishing
Citation
Obeng, Yaw S, Nguyen, Nhan V, Amoah, Papa K, Ahn, Jungjoon, Shalaginov, Mikhail Y et al. 2022. "Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge<sub>2</sub>Sb<sub>2</sub>Se<sub>5</sub> thin films." Journal of Applied Physics, 131 (7).
Version: Final published version
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