| dc.contributor.author | Zhang, Xiaofu | |
| dc.contributor.author | Charaev, Ilya | |
| dc.contributor.author | Liu, Huanlong | |
| dc.contributor.author | Zhou, Tony X | |
| dc.contributor.author | Zhu, Dong | |
| dc.contributor.author | Berggren, Karl K | |
| dc.contributor.author | Schilling, Andreas | |
| dc.date.accessioned | 2022-05-26T18:47:49Z | |
| dc.date.available | 2022-05-26T18:47:49Z | |
| dc.date.issued | 2021 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/142782 | |
| dc.language.iso | en | |
| dc.publisher | IOP Publishing | en_US |
| dc.relation.isversionof | 10.1088/1361-6668/AC1524 | en_US |
| dc.rights | Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International | en_US |
| dc.rights.uri | https://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | arXiv | en_US |
| dc.title | Physical properties of amorphous molybdenum silicide films for single-photon detectors | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Zhang, Xiaofu, Charaev, Ilya, Liu, Huanlong, Zhou, Tony X, Zhu, Dong et al. 2021. "Physical properties of amorphous molybdenum silicide films for single-photon detectors." Superconductor Science and Technology, 34 (9). | |
| dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.relation.journal | Superconductor Science and Technology | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2022-05-26T18:42:10Z | |
| dspace.orderedauthors | Zhang, X; Charaev, I; Liu, H; Zhou, TX; Zhu, D; Berggren, KK; Schilling, A | en_US |
| dspace.date.submission | 2022-05-26T18:42:12Z | |
| mit.journal.volume | 34 | en_US |
| mit.journal.issue | 9 | en_US |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
