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dc.contributor.authorDaskalakis, C
dc.contributor.authorKawase, Y
dc.date.accessioned2022-06-17T14:20:50Z
dc.date.available2022-06-17T14:20:50Z
dc.date.issued2017-09-01
dc.identifier.urihttps://hdl.handle.net/1721.1/143459
dc.description.abstractSuppose that we are given sample access to an unknown distribution p over n elements and an explicit distribution q over the same n elements. We would like to reject the null hypothesis "p = q" after seeing as few samples as possible, when p ≠q, while we never want to reject the null, when p = q. Well-known results show that ϵ(√ n/ϵ2) samples are necessary and sufficient for distinguishing whether p equals q versus p is ϵ -far from q in total variation distance. However, this requires the distinguishing radius ϵ to be fixed prior to deciding how many samples to request. Our goal is instead to design sequential hypothesis testers, i.e. online algorithms that request i.i.d. samples from p and stop as soon as they can confidently reject the hypothesis p = q, without being given a lower bound on the distance between p and q, when p ≠q. In particular, we want to minimize the number of samples requested by our tests as a function of the distance between p and q, and if p = q we want the algorithm, with high probability, to never reject the null. Our work is motivated by and addresses the practical challenge of sequential A/B testing in Statistics. We show that, when n = 2, any sequential hypothesis test must see Ω (1 /dtv(p,q)2 log log 1 dtv(p,q) ) samples, with high (constant) probability, before it rejects p = q, where dtv(p, q) is the-unknown to the tester-Total variation distance between p and q. We match the dependence of this lower bound on dtv(p, q) by proposing a sequential tester that rejects p = q from at most O √n/dtv(p,q)2 log log 1/dtv(p,q) samples with high (constant) probability. The Ω (√ n) dependence on the support size n is also known to be necessary. We similarly provide two-sample sequential hypothesis testers, when sample access is given to both p and q, and discuss applications to sequential A/B testing.en_US
dc.language.isoen
dc.relation.isversionof10.4230/LIPIcs.ESA.2017.32en_US
dc.rightsCreative Commons Attribution 3.0 unported licenseen_US
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/en_US
dc.sourceDROPSen_US
dc.titleOptimal stopping rules for sequential hypothesis testingen_US
dc.typeArticleen_US
dc.identifier.citationDaskalakis, C and Kawase, Y. 2017. "Optimal stopping rules for sequential hypothesis testing." Leibniz International Proceedings in Informatics, LIPIcs, 87.
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
dc.relation.journalLeibniz International Proceedings in Informatics, LIPIcsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2022-06-17T14:15:30Z
dspace.orderedauthorsDaskalakis, C; Kawase, Yen_US
dspace.date.submission2022-06-17T14:15:31Z
mit.journal.volume87en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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