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dc.contributor.authorDaskalakis, C
dc.contributor.authorDikkala, N
dc.contributor.authorKamath, G
dc.date.accessioned2022-06-17T15:58:25Z
dc.date.available2022-06-17T15:58:25Z
dc.date.issued2018-01-01
dc.identifier.urihttps://hdl.handle.net/1721.1/143463
dc.description.abstract© Copyright 2018 by SIAM. Given samples from an unknown multivariate distribution p, is it possible to distinguish whether p is the product of its marginals versus p being far from every product distribution? Similarly, is it possible to distinguish whether p equals a given distribution q versus p and q being far from each other? These problems of testing independence and goodness-of-fit have received enormous attention in statistics, information theory, and theoretical computer science, with sample-optimal algorithms known in several interesting regimes of parameters [BFF+01, Pan08, VV17, ADK15, DK16]. Unfortunately, it has also been understood that these problems become intractable in large dimensions, necessitating exponential sample complexity. Motivated by the exponential lower bounds for general distributions as well as the ubiquity of Markov Random Fields (MRFs) in the modeling of high-dimensional distributions, we initiate the study of distribution testing on structured multivariate distributions, and in particular the prototypical example of MRFs: the Ising Model. We demonstrate that, in this structured setting, we can avoid the curse of dimensionality, obtaining sample and time efficient testers for independence and goodness-of-fit. One of the key technical challenges we face along the way is bounding the variance of functions of the Ising model.en_US
dc.language.isoen
dc.publisherSociety for Industrial and Applied Mathematicsen_US
dc.relation.isversionof10.1137/1.9781611975031.130en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSIAMen_US
dc.titleTesting ising modelsen_US
dc.typeArticleen_US
dc.identifier.citationDaskalakis, C, Dikkala, N and Kamath, G. 2018. "Testing ising models." Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms.
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
dc.relation.journalProceedings of the Annual ACM-SIAM Symposium on Discrete Algorithmsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2022-06-17T14:41:37Z
dspace.orderedauthorsDaskalakis, C; Dikkala, N; Kamath, Gen_US
dspace.date.submission2022-06-17T14:41:38Z
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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