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dc.contributor.authorOrdentlich, Or
dc.contributor.authorPolyanskiy, Yury
dc.date.accessioned2022-07-19T12:28:20Z
dc.date.available2022-07-19T12:28:20Z
dc.date.issued2022
dc.identifier.urihttps://hdl.handle.net/1721.1/143842
dc.description.abstractFor any channel $P_{Y|X}$ the strong data processing constant is defined as the smallest number $\eta_{KL}\in[0,1]$ such that $I(U;Y)\le \eta_{KL} I(U;X)$ holds for any Markov chain $U-X-Y$. It is shown that the value of $\eta_{KL}$ is given by that of the best binary-input subchannel of $P_{Y|X}$. The same result holds for any $f$-divergence, verifying a conjecture of Cohen, Kemperman and Zbaganu (1998).en_US
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionof10.1109/TIT.2021.3130189en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT web domainen_US
dc.titleStrong Data Processing Constant is Achieved by Binary Inputsen_US
dc.typeArticleen_US
dc.identifier.citationOrdentlich, Or and Polyanskiy, Yury. 2022. "Strong Data Processing Constant is Achieved by Binary Inputs." IEEE Transactions on Information Theory, 68 (3).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Information and Decision Systems
dc.contributor.departmentMassachusetts Institute of Technology. Institute for Data, Systems, and Society
dc.relation.journalIEEE Transactions on Information Theoryen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-07-19T12:16:19Z
dspace.orderedauthorsOrdentlich, O; Polyanskiy, Yen_US
dspace.date.submission2022-07-19T12:16:20Z
mit.journal.volume68en_US
mit.journal.issue3en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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