| dc.contributor.author | Shan, Tixiao | |
| dc.contributor.author | Englot, Brendan | |
| dc.contributor.author | Ratti, Carlo | |
| dc.contributor.author | Rus, Daniela | |
| dc.date.accessioned | 2022-07-26T15:44:14Z | |
| dc.date.available | 2022-07-26T15:44:14Z | |
| dc.date.issued | 2021 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/144047 | |
| dc.language.iso | en | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
| dc.relation.isversionof | 10.1109/ICRA48506.2021.9561996 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | arXiv | en_US |
| dc.title | LVI-SAM: Tightly-coupled Lidar-Visual-Inertial Odometry via Smoothing and Mapping | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Shan, Tixiao, Englot, Brendan, Ratti, Carlo and Rus, Daniela. 2021. "LVI-SAM: Tightly-coupled Lidar-Visual-Inertial Odometry via Smoothing and Mapping." 2021 IEEE International Conference on Robotics and Automation (ICRA). | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Urban Studies and Planning | |
| dc.contributor.department | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.relation.journal | 2021 IEEE International Conference on Robotics and Automation (ICRA) | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2022-07-26T15:31:53Z | |
| dspace.orderedauthors | Shan, T; Englot, B; Ratti, C; Rus, D | en_US |
| dspace.date.submission | 2022-07-26T15:31:55Z | |
| mit.license | OPEN_ACCESS_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
