dc.contributor.author | Reidy, Kate | |
dc.contributor.author | Varnavides, Georgios | |
dc.contributor.author | Thomsen, Joachim Dahl | |
dc.contributor.author | Blackburn, Arthur | |
dc.contributor.author | Pham, Thang | |
dc.contributor.author | Kumar, Abinash | |
dc.contributor.author | LeBeau, James | |
dc.contributor.author | Ross, Frances | |
dc.date.accessioned | 2022-08-19T15:11:35Z | |
dc.date.available | 2022-08-19T15:11:35Z | |
dc.date.issued | 2020 | |
dc.identifier.uri | https://hdl.handle.net/1721.1/144374 | |
dc.language.iso | en | |
dc.publisher | Cambridge University Press (CUP) | en_US |
dc.relation.isversionof | 10.1017/S1431927620016104 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | Joachim Dahl Thomsen | en_US |
dc.title | Forbidden Reflection Moiré Patterns in metal-2D Material Interfaces | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Reidy, Kate, Varnavides, Georgios, Thomsen, Joachim Dahl, Blackburn, Arthur, Pham, Thang et al. 2020. "Forbidden Reflection Moiré Patterns in metal-2D Material Interfaces." Microscopy and Microanalysis, 26 (S2). | |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
dc.contributor.department | Massachusetts Institute of Technology. School of Engineering | |
dc.relation.journal | Microscopy and Microanalysis | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
dc.date.updated | 2022-08-19T15:04:31Z | |
dspace.orderedauthors | Reidy, K; Varnavides, G; Thomsen, JD; Blackburn, A; Pham, T; Kumar, A; LeBeau, J; Ross, F | en_US |
dspace.date.submission | 2022-08-19T15:04:32Z | |
mit.journal.volume | 26 | en_US |
mit.journal.issue | S2 | en_US |
mit.license | OPEN_ACCESS_POLICY | |
mit.metadata.status | Authority Work and Publication Information Needed | en_US |