| dc.contributor.author | Thomsen, Joachim Dahl | |
| dc.contributor.author | Reidy, Kate | |
| dc.contributor.author | Pham, Thang | |
| dc.contributor.author | Ross, Frances | |
| dc.date.accessioned | 2022-08-19T15:14:15Z | |
| dc.date.available | 2022-08-19T15:14:15Z | |
| dc.date.issued | 2020 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/144375 | |
| dc.language.iso | en | |
| dc.publisher | Cambridge University Press (CUP) | en_US |
| dc.relation.isversionof | 10.1017/S1431927620016931 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | Joachim Dahl Thomsen | en_US |
| dc.title | Nucleation and Growth of Metal Films and Nanocrystals on Two-dimensional Materials | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Thomsen, Joachim Dahl, Reidy, Kate, Pham, Thang and Ross, Frances. 2020. "Nucleation and Growth of Metal Films and Nanocrystals on Two-dimensional Materials." Microscopy and Microanalysis, 26 (S2). | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences | |
| dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | |
| dc.relation.journal | Microscopy and Microanalysis | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2022-08-19T15:10:09Z | |
| dspace.orderedauthors | Thomsen, JD; Reidy, K; Pham, T; Ross, F | en_US |
| dspace.date.submission | 2022-08-19T15:10:10Z | |
| mit.journal.volume | 26 | en_US |
| mit.journal.issue | S2 | en_US |
| mit.license | OPEN_ACCESS_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
