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dc.contributor.authorNi, Xinchen
dc.contributor.authorKopp, Reed
dc.contributor.authorKalfon-Cohen, Estelle
dc.contributor.authorFurtado, Carolina
dc.contributor.authorLee, Jeonyoon
dc.contributor.authorArteiro, Albertino
dc.contributor.authorBorstnar, Gregor
dc.contributor.authorMavrogordato, Mark N
dc.contributor.authorHelfen, Lukas
dc.contributor.authorSinclair, Ian
dc.contributor.authorSpearing, S Mark
dc.contributor.authorCamanho, Pedro P
dc.contributor.authorWardle, Brian L
dc.date.accessioned2022-10-04T16:30:32Z
dc.date.available2022-10-04T16:30:32Z
dc.date.issued2021
dc.identifier.urihttps://hdl.handle.net/1721.1/145665
dc.language.isoen
dc.publisherElsevier BVen_US
dc.relation.isversionof10.1016/J.COMPOSITESB.2021.108623en_US
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivs Licenseen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.sourceProf. Wardleen_US
dc.titleIn situ synchrotron computed tomography study of nanoscale interlaminar reinforcement and thin-ply effects on damage progression in composite laminatesen_US
dc.typeArticleen_US
dc.identifier.citationNi, Xinchen, Kopp, Reed, Kalfon-Cohen, Estelle, Furtado, Carolina, Lee, Jeonyoon et al. 2021. "In situ synchrotron computed tomography study of nanoscale interlaminar reinforcement and thin-ply effects on damage progression in composite laminates." Composites Part B: Engineering, 217.
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.relation.journalComposites Part B: Engineeringen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-10-04T16:25:12Z
dspace.orderedauthorsNi, X; Kopp, R; Kalfon-Cohen, E; Furtado, C; Lee, J; Arteiro, A; Borstnar, G; Mavrogordato, MN; Helfen, L; Sinclair, I; Spearing, SM; Camanho, PP; Wardle, BLen_US
dspace.date.submission2022-10-04T16:25:14Z
mit.journal.volume217en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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