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Comprehensive Study on High Purity Semiconducting Carbon Nanotube Extraction

dc.contributor.authorSrimani, Tathagata
dc.contributor.authorDing, Jianfu
dc.contributor.authorYu, Andrew
dc.contributor.authorKanhaiya, Pritpal
dc.contributor.authorLau, Christian
dc.contributor.authorHo, Rebecca
dc.contributor.authorHumes, Jefford
dc.contributor.authorKingston, Christopher T
dc.contributor.authorMalenfant, Patrick RL
dc.contributor.authorShulaker, Max M
dc.date.accessioned2022-10-07T13:29:46Z
dc.date.available2022-10-07T13:29:46Z
dc.date.issued2022
dc.identifier.urihttps://hdl.handle.net/1721.1/145741
dc.language.isoen
dc.publisherWileyen_US
dc.relation.isversionof10.1002/AELM.202101377en_US
dc.rightsCreative Commons Attribution 4.0 International licenseen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceWileyen_US
dc.titleComprehensive Study on High Purity Semiconducting Carbon Nanotube Extractionen_US
dc.typeArticleen_US
dc.identifier.citationSrimani, Tathagata, Ding, Jianfu, Yu, Andrew, Kanhaiya, Pritpal, Lau, Christian et al. 2022. "Comprehensive Study on High Purity Semiconducting Carbon Nanotube Extraction." Advanced Electronic Materials, 8 (9).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.relation.journalAdvanced Electronic Materialsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-10-07T13:25:35Z
dspace.orderedauthorsSrimani, T; Ding, J; Yu, A; Kanhaiya, P; Lau, C; Ho, R; Humes, J; Kingston, CT; Malenfant, PRL; Shulaker, MMen_US
dspace.date.submission2022-10-07T13:25:39Z
mit.journal.volume8en_US
mit.journal.issue9en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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