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dc.contributor.authorDavydova, Margarita
dc.contributor.authorPrembabu, Saranesh
dc.contributor.authorFu, Liang
dc.date.accessioned2022-10-31T14:09:41Z
dc.date.available2022-10-31T14:09:41Z
dc.date.issued2022
dc.identifier.urihttps://hdl.handle.net/1721.1/146053
dc.description.abstract<jats:p> We propose a universal mechanism for the Josephson diode effect in short Josephson junctions. The proposed mechanism is due to finite Cooper pair momentum and is a manifestation of simultaneous breaking of inversion and time-reversal symmetries. The diode efficiency is up to 40%, which corresponds to an asymmetry between the critical currents in opposite directions <jats:italic>I</jats:italic> <jats:sub>c+</jats:sub> / <jats:italic>I</jats:italic> <jats:sub>c−</jats:sub> ≈ 230%. We show that this arises from both the Doppler shift of the Andreev bound state energies and the phase-independent asymmetric current from the continuum. Last, we propose a simple scheme for achieving finite-momentum pairing, which does not rely on spin-orbit coupling and thus greatly expands existing platforms for the observation of supercurrent diode effects. </jats:p>en_US
dc.language.isoen
dc.publisherAmerican Association for the Advancement of Science (AAAS)en_US
dc.relation.isversionof10.1126/SCIADV.ABO0309en_US
dc.rightsCreative Commons Attribution 4.0 International licenseen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceScience Advancesen_US
dc.titleUniversal Josephson diode effecten_US
dc.typeArticleen_US
dc.identifier.citationDavydova, Margarita, Prembabu, Saranesh and Fu, Liang. 2022. "Universal Josephson diode effect." Science Advances, 8 (23).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics
dc.relation.journalScience Advancesen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-10-31T13:57:26Z
dspace.orderedauthorsDavydova, M; Prembabu, S; Fu, Len_US
dspace.date.submission2022-10-31T13:57:27Z
mit.journal.volume8en_US
mit.journal.issue23en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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