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dc.contributor.authorWang, Hao
dc.contributor.authorYeung, Dit-Yan
dc.date.accessioned2022-11-07T14:23:18Z
dc.date.available2022-11-07T14:23:18Z
dc.date.issued2020-09-28
dc.identifier.issn0360-0300
dc.identifier.urihttps://hdl.handle.net/1721.1/146181
dc.publisherACMen_US
dc.relation.isversionofhttp://dx.doi.org/10.1145/3409383en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceACMen_US
dc.titleA Survey on Bayesian Deep Learningen_US
dc.typeArticleen_US
dc.identifier.citationWang, Hao and Yeung, Dit-Yan. 2020. "A Survey on Bayesian Deep Learning." ACM Computing Surveys.
dc.contributor.departmentMIT-IBM Watson AI Lab
dc.relation.journalACM Computing Surveysen_US
dc.identifier.mitlicensePUBLISHER_POLICY
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-11-02T18:20:55Z
dc.language.rfc3066en
dc.rights.holderThe author(s)
dspace.date.submission2022-11-02T18:20:56Z
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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