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dc.contributor.authorEfremenko, Klim
dc.contributor.authorHaeupler, Bernhard
dc.contributor.authorKalai, Yael Tauman
dc.contributor.authorKamath, Pritish
dc.contributor.authorKol, Gillat
dc.contributor.authorResch, Nicolas
dc.contributor.authorSaxena, Raghuvansh R.
dc.date.accessioned2022-11-15T13:56:31Z
dc.date.available2022-11-15T13:56:31Z
dc.date.issued2022-06-09
dc.identifier.isbn978-1-4503-9264-8
dc.identifier.urihttps://hdl.handle.net/1721.1/146428
dc.publisherACM|Proceedings of the 54th Annual ACM SIGACT Symposium on Theory of Computingen_US
dc.relation.isversionofhttps://doi.org/10.1145/3519935.3520007en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceACM|Proceedings of the 54th Annual ACM SIGACT Symposium on Theory of Computingen_US
dc.titleCircuits Resilient to Short-Circuit Errorsen_US
dc.typeArticleen_US
dc.identifier.citationEfremenko, Klim, Haeupler, Bernhard, Kalai, Yael Tauman, Kamath, Pritish, Kol, Gillat et al. 2022. "Circuits Resilient to Short-Circuit Errors."
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.mitlicensePUBLISHER_POLICY
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2022-11-03T12:12:43Z
dc.language.rfc3066en
dc.rights.holderThe author(s)
dspace.date.submission2022-11-03T12:12:44Z
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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