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dc.contributor.authorAdrian, PJ
dc.contributor.authorBachmann, B
dc.contributor.authorBetti, R
dc.contributor.authorBirkel, A
dc.contributor.authorHeuer, PV
dc.contributor.authorJohnson, M Gatu
dc.contributor.authorKabadi, NV
dc.contributor.authorKnauer, JP
dc.contributor.authorKunimune, J
dc.contributor.authorLi, CK
dc.contributor.authorMannion, OM
dc.contributor.authorPetrasso, RD
dc.contributor.authorRegan, SP
dc.contributor.authorRinderknecht, HG
dc.contributor.authorStoeckl, C
dc.contributor.authorSéguin, FH
dc.contributor.authorSorce, A
dc.contributor.authorShah, RC
dc.contributor.authorSutcliffe, GD
dc.contributor.authorFrenje, JA
dc.date.accessioned2023-01-04T18:19:29Z
dc.date.available2023-01-04T18:19:29Z
dc.date.issued2022-11-01
dc.identifier.urihttps://hdl.handle.net/1721.1/146970
dc.description.abstract<jats:p> A system of x-ray imaging spectrometer (XRIS) has been implemented at the OMEGA Laser Facility and is capable of spatially and spectrally resolving x-ray self-emission from 5 to 40 keV. The system consists of three independent imagers with nearly orthogonal lines of sight for 3D reconstructions of the x-ray emission region. The distinct advantage of the XRIS system is its large dynamic range, which is enabled by the use of tantalum apertures with radii ranging from 50 μm to 1 mm, magnifications of 4 to 35×, and image plates with any filtration level. In addition, XRIS is capable of recording 1–100’s images along a single line of sight, facilitating advanced statistical inference on the detailed structure of the x-ray emitting regions. Properties such as P0 and P2 of an implosion are measured to 1% and 10% precision, respectively. Furthermore, T<jats:sub> e</jats:sub> can be determined with 5% accuracy. </jats:p>en_US
dc.language.isoen
dc.publisherAIP Publishingen_US
dc.relation.isversionof10.1063/5.0101655en_US
dc.rightsCreative Commons Attribution 4.0 International licenseen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAmerican Institute of Physics (AIP)en_US
dc.titleX-ray-imaging spectrometer (XRIS) for studies of residual kinetic energy and low-mode asymmetries in inertial confinement fusion implosions at OMEGA (invited)en_US
dc.typeArticleen_US
dc.identifier.citationAdrian, PJ, Bachmann, B, Betti, R, Birkel, A, Heuer, PV et al. 2022. "X-ray-imaging spectrometer (XRIS) for studies of residual kinetic energy and low-mode asymmetries in inertial confinement fusion implosions at OMEGA (invited)." Review of Scientific Instruments, 93 (11).
dc.contributor.departmentMassachusetts Institute of Technology. Plasma Science and Fusion Center
dc.relation.journalReview of Scientific Instrumentsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2023-01-04T18:14:33Z
dspace.orderedauthorsAdrian, PJ; Bachmann, B; Betti, R; Birkel, A; Heuer, PV; Johnson, MG; Kabadi, NV; Knauer, JP; Kunimune, J; Li, CK; Mannion, OM; Petrasso, RD; Regan, SP; Rinderknecht, HG; Stoeckl, C; Séguin, FH; Sorce, A; Shah, RC; Sutcliffe, GD; Frenje, JAen_US
dspace.date.submission2023-01-04T18:14:37Z
mit.journal.volume93en_US
mit.journal.issue11en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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