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dc.contributor.authorGuo, Zhen
dc.contributor.authorSong, Jung Ki
dc.contributor.authorBarbastathis, George
dc.contributor.authorGlinsky, Michael E
dc.contributor.authorVaughn, Courtenay T
dc.contributor.authorLarson, Kurt W
dc.contributor.authorAlpert, Bradley K
dc.contributor.authorLevine, Zachary H
dc.date.accessioned2023-05-18T20:05:25Z
dc.date.available2023-05-18T20:05:25Z
dc.date.issued2022
dc.identifier.urihttps://hdl.handle.net/1721.1/150775
dc.language.isoen
dc.publisherSociety for Imaging Science & Technologyen_US
dc.relation.isversionof10.2352/EI.2022.34.5.MLSI-202en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttps://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleAdvantage of Machine Learning over Maximum Likelihood in Limited-Angle Low-Photon X-Ray Tomographyen_US
dc.typeArticleen_US
dc.identifier.citationGuo, Zhen, Song, Jung Ki, Barbastathis, George, Glinsky, Michael E, Vaughn, Courtenay T et al. 2022. "Advantage of Machine Learning over Maximum Likelihood in Limited-Angle Low-Photon X-Ray Tomography." Electronic Imaging, 34 (5).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.relation.journalElectronic Imagingen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2023-05-18T20:03:32Z
dspace.orderedauthorsGuo, Z; Song, JK; Barbastathis, G; Glinsky, ME; Vaughn, CT; Larson, KW; Alpert, BK; Levine, ZHen_US
dspace.date.submission2023-05-18T20:03:34Z
mit.journal.volume34en_US
mit.journal.issue5en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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