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dc.contributor.authorZhou, Jiawei
dc.contributor.authorZhu, Hangtian
dc.contributor.authorSong, Qichen
dc.contributor.authorDing, Zhiwei
dc.contributor.authorMao, Jun
dc.contributor.authorRen, Zhifeng
dc.contributor.authorChen, Gang
dc.date.accessioned2023-05-31T15:19:47Z
dc.date.available2023-05-31T15:19:47Z
dc.date.issued2022
dc.identifier.urihttps://hdl.handle.net/1721.1/150832
dc.description.abstract<jats:title>Abstract</jats:title><jats:p>Doping is central for solid-state devices from transistors to thermoelectric energy converters. The interaction between electrons and dopants plays a pivotal role in carrier transport. Conventional theory suggests that the Coulomb field of the ionized dopants limits the charge mobility at high carrier densities, and that either the atomic details of the dopants are unimportant or the mobility can only be further degraded, while experimental results often show that dopant choice affects mobility. In practice, the selection of dopants is still mostly a trial-and-error process. Here we demonstrate, via first-principles simulation and comparison with experiments, that a large short-range perturbation created by selected dopants can in fact counteract the long-range Coulomb field, leading to electron transport that is nearly immune to the presence of dopants. Such “cloaking” of dopants leads to enhanced mobilities at high carrier concentrations close to the intrinsic electron–phonon scattering limit. We show that the ionic radius can be used to guide dopant selection in order to achieve such an electron-cloaking effect. Our finding provides guidance to the selection of dopants for solid-state conductors to achieve high mobility for electronic, photonic, and energy conversion applications.</jats:p>en_US
dc.language.isoen
dc.publisherSpringer Science and Business Media LLCen_US
dc.relation.isversionof10.1038/S41467-022-29958-2en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en_US
dc.sourceNatureen_US
dc.titleMobility enhancement in heavily doped semiconductors via electron cloakingen_US
dc.typeArticleen_US
dc.identifier.citationZhou, Jiawei, Zhu, Hangtian, Song, Qichen, Ding, Zhiwei, Mao, Jun et al. 2022. "Mobility enhancement in heavily doped semiconductors via electron cloaking." Nature Communications, 13 (1).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.relation.journalNature Communicationsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2023-05-31T15:17:20Z
dspace.orderedauthorsZhou, J; Zhu, H; Song, Q; Ding, Z; Mao, J; Ren, Z; Chen, Gen_US
dspace.date.submission2023-05-31T15:17:22Z
mit.journal.volume13en_US
mit.journal.issue1en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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