Enhancement-Mode GaN Transistor Technology for Harsh Environment Operation
Author(s)
Yuan, Mengyang; Niroula, John; Xie, Qingyun; Rajput, Nitul S.; Fu, Kai; Luo, Shisong; Das, Sagar Kumar; Iqbal, Abdullah Jubair Bin; Sikder, Bejoy; Isamotu, Mohamed Fadil; Oh, Minsik; Eisner, Savannah R.; Senesky, Debbie G.; Hunter, Gary W.; Chowdhury, Nadim; Zhao, Yuji; Palacios, Tomás; ... Show more Show less
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Metadata
Show full item recordDate issued
2023-07Department
Massachusetts Institute of Technology. Microsystems Technology LaboratoriesJournal
IEEE Electron Device Letters
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Yuan, Mengyang, Niroula, John, Xie, Qingyun, Rajput, Nitul S., Fu, Kai et al. 2023. "Enhancement-Mode GaN Transistor Technology for Harsh Environment Operation." IEEE Electron Device Letters, 44 (7).
Version: Author's final manuscript
ISSN
0741-3106
1558-0563
Keywords
Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials