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dc.contributor.authorHay, Robert
dc.contributor.authorBhattacharya, Ranajoy
dc.contributor.authorChern, Winston
dc.contributor.authorRughoobur, Girish
dc.contributor.authorAkinwande, Akintunde I.
dc.contributor.authorBrowning, Jim
dc.date.accessioned2023-12-14T16:12:50Z
dc.date.available2023-12-14T16:12:50Z
dc.date.issued2023-11-29
dc.identifier.urihttps://hdl.handle.net/1721.1/153161
dc.description.abstractVacuum transistors (VTs) are promising candidates in electronics due to their fast response and ability to function in harsh environments. In this study, several oscillator and logic gate circuit simulations using VTs are demonstrated. Silicon-gated field emitter arrays (Si-GFEAs) with 1000 × 1000 arrays were used experimentally to create a VT model. First, transfer and output characteristics sweeps were measured, and based on those data, an LTspice vacuum transistor (VT) model was developed. Then, the model was used to develop Wein and Ring oscillator circuits. The circuits were analytically simulated using LTspice, where the collector bias voltage was 200 V DC, and the gate bias voltage was 30–40 V DC. The Wein oscillator circuit produced a frequency of 102 kHz with a magnitude of 26 Vpp. The Ring oscillator produced a frequency of 1.14 MHz with a magnitude of 4 Vpp. Furthermore, two logic circuits, NOR and NAND gates, were also demonstrated using LTspice modeling. These simulation results illustrate the feasibility of integrating VTs into functional integrated circuits and provide a design approach for future on-chip vacuum transistors applied in logic or radio-frequency (RF) devices.en_US
dc.publisherMultidisciplinary Digital Publishing Instituteen_US
dc.relation.isversionofhttp://dx.doi.org/10.3390/app132312807en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceMultidisciplinary Digital Publishing Instituteen_US
dc.titleSimulation Modelling of Silicon Gated Field Emitter Based Electronic Circuitsen_US
dc.typeArticleen_US
dc.identifier.citationApplied Sciences 13 (23): 12807 (2023)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.mitlicensePUBLISHER_CC
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2023-12-08T15:10:45Z
dspace.date.submission2023-12-08T15:10:45Z
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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