Show simple item record

dc.contributor.authorKim, Ki Seok
dc.contributor.authorKang, Ji Eun
dc.contributor.authorChen, Peng
dc.contributor.authorKim, Sungkyu
dc.contributor.authorJi, Jongho
dc.contributor.authorYeom, Geun Young
dc.contributor.authorKim, Jeehwan
dc.contributor.authorKum, Hyun S.
dc.date.accessioned2024-02-23T21:28:42Z
dc.date.available2024-02-23T21:28:42Z
dc.date.issued2022-04-01
dc.identifier.issn2166-532X
dc.identifier.urihttps://hdl.handle.net/1721.1/153571
dc.description.abstractEpitaxial lift-off techniques, which aim to separate ultrathin single-crystalline epitaxial layers off of the substrate, are becoming increasingly important due to the need of lightweight and flexible devices for heterogeneously integrated ultracompact semiconductor platforms and bioelectronics. Remote epitaxy is a relatively newly discovered epitaxial lift-off technique that allows substrate-seeded epitaxial growth of ultrathin films through few layers of graphene. This universal epitaxial lift-off technique allows freestanding single-crystal membrane fabrication very quickly at low cost. However, the conventional method of remote epitaxy requires transfer of graphene grown on another substrate to the target single-crystalline substrate, which results in organic and metallic residues as well as macroscopic defects such as cracks and wrinkles, significantly reducing the yield of remote epitaxy. Here, we show that direct growth of thick graphene on the target single-crystalline substrate (SrTiO3 for this study) followed by atomic layer etching (ALE) of the graphene layers create a defect- and residue-free graphene surface for high yield remote epitaxy. We find that the ALE efficiently removes one atomic layer of graphene per cycle, while also clearing multi-dots (clumps of carbon atoms) that form during nucleation of the graphene layers. Our results show that direct-grown graphene on the desired substrate accompanied by ALE might potentially be an ideal pathway toward commercialization of remote epitaxy.en_US
dc.language.isoen
dc.publisherAIP Publishingen_US
dc.relation.isversionof10.1063/5.0087890en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAIP Publishingen_US
dc.subjectGeneral Engineeringen_US
dc.subjectGeneral Materials Scienceen_US
dc.titleAtomic layer-by-layer etching of graphene directly grown on SrTiO3 substrates for high-yield remote epitaxy and lift-offen_US
dc.typeArticleen_US
dc.identifier.citationKim, Ki Seok, Kang, Ji Eun, Chen, Peng, Kim, Sungkyu, Ji, Jongho et al. 2022. "Atomic layer-by-layer etching of graphene directly grown on SrTiO3 substrates for high-yield remote epitaxy and lift-off." APL Materials, 10 (4).
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronics
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.relation.journalAPL Materialsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2024-02-23T21:22:38Z
dspace.orderedauthorsKim, KS; Kang, JE; Chen, P; Kim, S; Ji, J; Yeom, GY; Kim, J; Kum, HSen_US
dspace.date.submission2024-02-23T21:22:41Z
mit.journal.volume10en_US
mit.journal.issue4en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record