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dc.contributor.authorBruno, Simone
dc.contributor.authorWilliams, Ruth J.
dc.contributor.authorDel Vecchio, Domitilla
dc.date.accessioned2024-07-17T20:56:53Z
dc.date.available2024-07-17T20:56:53Z
dc.date.issued2022-07-12
dc.identifier.urihttps://hdl.handle.net/1721.1/155700
dc.description2022 European Control Conference (ECC), London, United Kingdom, 2022en_US
dc.description.abstractEpigenetic cell memory (ECM), the inher-itance of gene expression patterns without changes in genetic sequence, is a critical property of multi-cellular organisms. Chromatin state, as dictated by histone covalent modifications, has recently appeared as a mediator of ECM. In this paper, we conduct a stochastic analysis of the histone modification circuit that controls chromatin state to determine key biological parameters that affect ECM. Specifically, we derive a one-dimensional Markov chain model of the circuit and analytically evaluate both the stationary probability distribution of chromatin state and the mean time to switch between active and repressed chromatin states. We then validate our analytical findings using stochastic simulations of the original higher dimensional circuit reaction model. Our analysis shows that as the speed of basal decay of histone modifications decreases compared to the speed of autocatalysis, the stationary probability distribution becomes bimodal and increasingly concentrated about the active and repressed chromatin states. Accordingly, the switching time between active and repressed chromatin states becomes larger. These results indicate that time scale separation among key constituent processes of the histone modification circuit controls ECM.en_US
dc.language.isoen
dc.publisherIEEEen_US
dc.relation.isversionof10.23919/ecc55457.2022.9838047en_US
dc.rightsCreative Commons Attribution-Noncommercial-ShareAlikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceAuthoren_US
dc.titleModel reduction and stochastic analysis of the histone modification circuiten_US
dc.typeArticleen_US
dc.identifier.citationS. Bruno, R. J. Williams and D. Del Vecchio, "Model reduction and stochastic analysis of the histone modification circuit," 2022 European Control Conference (ECC), London, United Kingdom, 2022, pp. 264-271.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.relation.journal2022 European Control Conference (ECC)en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2024-07-17T20:51:55Z
dspace.orderedauthorsBruno, S; Williams, RJ; Del Vecchio, Den_US
dspace.date.submission2024-07-17T20:51:57Z
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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