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dc.contributor.authorHazard, TM
dc.contributor.authorWoods, W
dc.contributor.authorRosenberg, D
dc.contributor.authorDas, R
dc.contributor.authorHirjibehedin, CF
dc.contributor.authorKim, DK
dc.contributor.authorKnecht, JM
dc.contributor.authorMallek, J
dc.contributor.authorMelville, A
dc.contributor.authorNiedzielski, BM
dc.contributor.authorSerniak, K
dc.contributor.authorSliwa, KM
dc.contributor.authorYost, DRW
dc.contributor.authorYoder, JL
dc.contributor.authorOliver, WD
dc.contributor.authorSchwartz, ME
dc.date.accessioned2024-09-19T19:57:07Z
dc.date.available2024-09-19T19:57:07Z
dc.date.issued2023-10-09
dc.identifier.urihttps://hdl.handle.net/1721.1/156908
dc.description.abstractThe large physical size of superconducting qubits and their associated on-chip control structures presents a practical challenge toward building a large-scale quantum computer. In particular, transmons require a high-quality-factor shunting capacitance that is typically achieved by using a large coplanar capacitor. Other components, such as superconducting microwave resonators used for qubit state readout, are typically constructed from coplanar waveguides, which are millimeters in length. Here, we use compact superconducting through-silicon vias to realize lumped-element capacitors in both qubits and readout resonators to significantly reduce the on-chip footprint of both of these circuit elements. We measure two types of devices to show that through-silicon vias are of sufficient quality to be used as capacitive circuit elements and provide a significant reduction in size over existing approaches.en_US
dc.language.isoen
dc.publisherAIP Publishingen_US
dc.relation.isversionof10.1063/5.0170055en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAIP Publishingen_US
dc.titleCharacterization of superconducting through-silicon vias as capacitive elements in quantum circuitsen_US
dc.typeArticleen_US
dc.identifier.citationT. M. Hazard, W. Woods, D. Rosenberg, R. Das, C. F. Hirjibehedin, D. K. Kim, J. M. Knecht, J. Mallek, A. Melville, B. M. Niedzielski, K. Serniak, K. M. Sliwa, D. R. W. Yost, J. L. Yoder, W. D. Oliver, M. E. Schwartz; Characterization of superconducting through-silicon vias as capacitive elements in quantum circuits. Appl. Phys. Lett. 9 October 2023; 123 (15): 154004.en_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2024-09-19T19:50:18Z
dspace.orderedauthorsHazard, TM; Woods, W; Rosenberg, D; Das, R; Hirjibehedin, CF; Kim, DK; Knecht, JM; Mallek, J; Melville, A; Niedzielski, BM; Serniak, K; Sliwa, KM; Yost, DRW; Yoder, JL; Oliver, WD; Schwartz, MEen_US
dspace.date.submission2024-09-19T19:50:21Z
mit.journal.volume123en_US
mit.journal.issue15en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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