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dc.contributor.authorDodds, Laura
dc.contributor.authorShanbhag, Hailan
dc.contributor.authorGuan, Junfeng
dc.contributor.authorGupta, Saurabh
dc.contributor.authorHassanieh, Haitham
dc.date.accessioned2025-01-27T21:29:12Z
dc.date.available2025-01-27T21:29:12Z
dc.date.issued2024-12-04
dc.identifier.isbn979-8-4007-0489-5
dc.identifier.urihttps://hdl.handle.net/1721.1/158077
dc.descriptionACM MobiCom ’24, November 18–22, 2024, Washington D.C., DC, USAen_US
dc.description.abstractWe present the design, implementation, and evaluation of RFlect, a mmWave imaging system capable of producing around-the-corner high-resolution images in practical environments. RFlect leverages signals reflected off complex surfaces (e.g., poles, concave surfaces, or composition of multiple surfaces) to image objects that are not in the RF line-of-sight. RFlect models the reflections and introduces reconstruction algorithms for different types of surfaces. It also leverages a novel method for precisely mapping the location and geometry of the reflecting surface. We also derive the theoretical resolution and coverage for different reflecting surface geometries. We built a prototype of RFlect and performed extensive evaluations to demonstrate its ability to reconstruct the shape of objects around the corner, with an average Chamfer Distance of 2cm and 3D F-Score of 88.6%.en_US
dc.publisherACM|The 30th Annual International Conference on Mobile Computing and Networkingen_US
dc.relation.isversionofhttps://doi.org/10.1145/3636534.3690671en_US
dc.rightsCreative Commons Attribution-Noncommercial-ShareAlikeen_US
dc.rights.urihttps://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceAssociation for Computing Machineryen_US
dc.titleAround the Corner mmWave Imaging in Practical Environmentsen_US
dc.typeArticleen_US
dc.identifier.citationDodds, Laura, Shanbhag, Hailan, Guan, Junfeng, Gupta, Saurabh and Hassanieh, Haitham. 2024. "Around the Corner mmWave Imaging in Practical Environments."
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.mitlicensePUBLISHER_CC
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2025-01-01T08:47:10Z
dc.language.rfc3066en
dc.rights.holderThe author(s)
dspace.date.submission2025-01-01T08:47:11Z
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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