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dc.contributor.authorSpiekermann, Kevin A
dc.contributor.authorStuyver, Thijs
dc.contributor.authorPattanaik, Lagnajit
dc.contributor.authorGreen, William H
dc.date.accessioned2025-07-08T19:20:01Z
dc.date.available2025-07-08T19:20:01Z
dc.date.issued2023-10-06
dc.identifier.urihttps://hdl.handle.net/1721.1/159976
dc.description.abstractIn a recent article in this journal, van Gerwen et al (2022 Mach. Learn.: Sci. Technol. 3 045005) presented a kernel ridge regression model to predict reaction barrier heights. Here, we comment on the utility of that model and present references and results that contradict several statements made in that article. Our primary interest is to offer a broader perspective by presenting three aspects that are essential for researchers to consider when creating models for chemical kinetics: (1) are the model’s prediction targets and associated errors sufficient for practical applications? (2) Does the model prioritize user-friendly inputs so it is practical for others to integrate into prediction workflows? (3) Does the analysis report performance on both interpolative and more challenging extrapolative data splits so users have a realistic idea of the likely errors in the model’s predictions?en_US
dc.language.isoen
dc.publisherIOP Publishingen_US
dc.relation.isversionof10.1088/2632-2153/acee42en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceIOP Publishingen_US
dc.titleComment on ‘Physics-based representations for machine learning properties of chemical reactions’en_US
dc.typeArticleen_US
dc.identifier.citationKevin A Spiekermann et al 2023 Mach. Learn.: Sci. Technol. 4 048001.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemical Engineeringen_US
dc.relation.journalMachine Learning: Science and Technologyen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2025-07-08T18:47:40Z
dspace.orderedauthorsSpiekermann, KA; Stuyver, T; Pattanaik, L; Green, WHen_US
dspace.date.submission2025-07-08T18:47:41Z
mit.journal.volume4en_US
mit.journal.issue4en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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