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dc.contributor.authorDefferriere, Thomas
dc.contributor.authorTuller, Harry L.
dc.date.accessioned2025-09-22T18:08:18Z
dc.date.available2025-09-22T18:08:18Z
dc.date.issued2025-05-13
dc.identifier.urihttps://hdl.handle.net/1721.1/162776
dc.description.abstractOptoionics, involving light-modulated ionic transport in ionic solids, parallels optoelectronics in semiconductors and offers novel device design opportunities across various fields. Among these opportunities, grain boundary phenomena related to radiation-induced electron/hole pair generation and charge trapping at the boundaries causing a modulation in ionic current could enable fast, sensitive, and reversible radiation detectors. The robustness of ionic solids in chemical, structural, and thermal aspects in turn makes them scalable and robust alternatives to traditional semiconductor detectors. This article explores the theoretical underpinnings, experimental breakthroughs, and design considerations needed to optimize such optoionic devices.en_US
dc.publisherSpringer International Publishingen_US
dc.relation.isversionofhttps://doi.org/10.1557/s43579-025-00726-9en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceSpringer International Publishingen_US
dc.titleOptoionics: New opportunity for ionic conduction-based radiation detectionen_US
dc.typeArticleen_US
dc.identifier.citationDefferriere, T., Tuller, H.L. Optoionics: New opportunity for ionic conduction-based radiation detection. MRS Commun. 15, 523–532 (2025).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.relation.journalMRS Communicationsen_US
dc.identifier.mitlicensePUBLISHER_CC
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2025-07-18T15:35:27Z
dc.language.rfc3066en
dc.rights.holderThe Author(s)
dspace.embargo.termsN
dspace.date.submission2025-07-18T15:35:27Z
mit.journal.volume15en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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