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dc.contributor.authorWallace, GM
dc.contributor.authorBai, Z
dc.contributor.authorBertelli, N
dc.contributor.authorBethel, EW
dc.contributor.authorPerciano, T
dc.contributor.authorShiraiwa, S
dc.contributor.authorWright, JC
dc.date.accessioned2026-02-17T15:31:45Z
dc.date.available2026-02-17T15:31:45Z
dc.date.issued2023-08-18
dc.identifier.urihttps://hdl.handle.net/1721.1/164887
dc.description.abstractThree machine learning techniques (multilayer perceptron, random forest, and Gaussian process) provide fast surrogate models for lower hybrid current drive (LHCD) simulations. A single GENRAY/CQL3D simulation without radial diffusion of fast electrons requires several minutes of wall-clock time to complete, which is acceptable for many purposes, but too slow for integrated modeling and real-time control applications. More accurate simulations with fast electron diffusion are even slower, requiring multiple hours of run time with parallel processing. The machine learning models use a database of 16,000+ GEN-RAY/CQL3D simulations for training, validation, and testing. Latin hypercube sampling methods implemented in πScope ensure that the database covers the range of 9 input parameters (ne0, Te0, Ip, Bt, R0, n∥︀, Ze f f, Vloop, PLHCD) with sufficient density in all regions of parameter space. The surrogate models reduce the computation time from minutes-hours to ms with high accuracy across the input parameter space. Data-driven surrogate models also allow for solving inverse and “lateral” problems. A surrogate model for the inverse problem maps from a desired current drive or power deposition profile to a set of input parameters that would result in such a profile, while a surrogate model for the lateral problem maps from a measured experimental quantity such as hard x-ray emission to a current drive or power deposition profile. The πScope database creation workflow is flexible and applicable to other RF simulation codes such as TORIC.en_US
dc.language.isoen
dc.publisherAIP Publishingen_US
dc.relation.isversionofhttps://doi.org/10.1063/5.0162422en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAIP Publishingen_US
dc.titleTowards fast, accurate predictions of RF simulations via data-driven modeling: Forward and lateral modelsen_US
dc.typeArticleen_US
dc.identifier.citationG. M. Wallace, Z. Bai, N. Bertelli, E. W. Bethel, T. Perciano, S. Shiraiwa, J. C. Wright; Towards fast, accurate predictions of RF simulations via data-driven modeling: Forward and lateral models. AIP Conf. Proc. 18 August 2023; 2984 (1): 090008.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Plasma Science and Fusion Centeren_US
dc.relation.journalAIP Conference Proceedingsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2026-02-17T15:26:02Z
dspace.orderedauthorsWallace, GM; Bai, Z; Bertelli, N; Bethel, EW; Perciano, T; Shiraiwa, S; Wright, JCen_US
dspace.date.submission2026-02-17T15:26:03Z
mit.journal.volume2984en_US
mit.journal.issue1en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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