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dc.contributor.authordeQuilettes, Dane W
dc.contributor.authorYoo, Jason J
dc.contributor.authorBrenes, Roberto
dc.contributor.authorKosasih, Felix Utama
dc.contributor.authorLaitz, Madeleine
dc.contributor.authorDou, Benjia Dak
dc.contributor.authorGraham, Daniel J
dc.contributor.authorHo, Kevin
dc.contributor.authorShi, Yangwei
dc.contributor.authorShin, Seong Sik
dc.contributor.authorDucati, Caterina
dc.contributor.authorBawendi, Moungi G
dc.contributor.authorBulović, Vladimir
dc.date.accessioned2026-03-03T17:02:02Z
dc.date.available2026-03-03T17:02:02Z
dc.date.issued2024-02-28
dc.identifier.urihttps://hdl.handle.net/1721.1/164996
dc.description.abstractThe ability to reduce energy loss at semiconductor surfaces through passivation or surface field engineering is an essential step in the manufacturing of efficient photovoltaic (PV) and optoelectronic devices. Similarly, surface modification of emerging halide perovskites with quasi-two-dimensional (2D) heterostructures is now ubiquitous to achieve PV power conversion efficiencies (PCEs) >25%, yet a fundamental understanding to how these treatments function is still generally lacking. Here we use a unique combination of depth-sensitive nanoscale characterization techniques to uncover a tunable passivation strategy and mechanism found in perovskite PV devices that were the first to reach the >25% PCE milestone. Namely, treatment with hexylammonium bromide leads to the simultaneous formation of an iodide-rich 2D layer along with a Br halide gradient that extends from defective surfaces and grain boundaries into the bulk three-dimensional (3D) layer. This interface can be optimized to extend the charge carrier lifetime to record values >30 μs and to reduce interfacial recombination velocities to values as low as <7 cm s−1.en_US
dc.language.isoen
dc.publisherSpringer Science and Business Media LLCen_US
dc.relation.isversionof10.1038/s41560-024-01470-5en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceOSTIen_US
dc.titleReduced recombination via tunable surface fields in perovskite thin filmsen_US
dc.typeArticleen_US
dc.identifier.citationdeQuilettes, D.W., Yoo, J.J., Brenes, R. et al. Reduced recombination via tunable surface fields in perovskite thin films. Nat Energy 9, 457–466 (2024).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalNature Energyen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2026-03-03T16:52:41Z
dspace.orderedauthorsdeQuilettes, DW; Yoo, JJ; Brenes, R; Kosasih, FU; Laitz, M; Dou, BD; Graham, DJ; Ho, K; Shi, Y; Shin, SS; Ducati, C; Bawendi, MG; Bulović, Ven_US
dspace.date.submission2026-03-03T16:52:43Z
mit.journal.volume9en_US
mit.journal.issue4en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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