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dc.contributor.authorLou, Benjamin
dc.contributor.authorLoughlin, Hudson A
dc.contributor.authorMavalvala, Nergis
dc.date.accessioned2026-04-15T15:25:04Z
dc.date.available2026-04-15T15:25:04Z
dc.date.issued2025-10-17
dc.identifier.urihttps://hdl.handle.net/1721.1/165450
dc.description.abstractEntanglement often increases quantum measurement schemes’ sensitivity. However, we find that in precision measurements with zero-mean Gaussian states, such as squeezed states, entanglement between different paths degrades measurement sensitivity. We prove an inverse relationship between entanglement entropy and sensitivity for measurements of single-mode phase shifts in multimode systems and for phase shifts on both modes in two-mode systems. In the two-mode case, which models devices such as interferometers, we find that entanglement strongly degrades differential phase sensitivity. Finally, we show that minimizing entanglement between paths maximizes the phase sensitivity of 𝑁-mode systems with zero-mean Gaussian state inputs.en_US
dc.language.isoen
dc.publisherAmerican Physical Society (APS)en_US
dc.relation.isversionofhttps://doi.org/10.1103/9zyr-by5pen_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAmerican Physical Society (APS)en_US
dc.titleTrade-off between path entanglement and quantum sensitivityen_US
dc.typeArticleen_US
dc.identifier.citationLou, Benjamin, Loughlin, Hudson A and Mavalvala, Nergis. 2025. "Trade-off between path entanglement and quantum sensitivity." Physical Review Research, 7 (4).
dc.contributor.departmentLIGO (Observatory : Massachusetts Institute of Technology)en_US
dc.relation.journalPhysical Review Researchen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2026-04-15T15:20:51Z
dspace.orderedauthorsLou, B; Loughlin, HA; Mavalvala, Nen_US
dspace.date.submission2026-04-15T15:20:52Z
mit.journal.volume7en_US
mit.journal.issue4en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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