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dc.contributor.authorGuilbert, H.
dc.contributor.authorRen, Z. F.
dc.contributor.authorLan, Y. C.
dc.contributor.authorWang, D. Z.
dc.contributor.authorLee, H.
dc.contributor.authorYang, J.
dc.contributor.authorJoshi, G.
dc.contributor.authorWang, X. W.
dc.contributor.authorVashaee, D.
dc.contributor.authorChen, Gang
dc.contributor.authorDresselhaus, Mildred
dc.contributor.authorPillitteri, A.
dc.contributor.authorZhu, G. H.
dc.date.accessioned2010-02-03T14:24:48Z
dc.date.available2010-02-03T14:24:48Z
dc.date.issued2009-05
dc.date.submitted2008-11
dc.identifier.issn0031-9007
dc.identifier.urihttp://hdl.handle.net/1721.1/51346
dc.description.abstractThe mechanism for phonon scattering by nanostructures and by point defects in nanostructured silicon (Si) and the silicon germanium (Ge) alloy and their thermoelectric properties are investigated. We found that the thermal conductivity is reduced by a factor of 10 in nanostructured Si in comparison with bulk crystalline Si. However, nanosize interfaces are not as effective as point defects in scattering phonons with wavelengths shorter than 1 nm. We further found that a 5  at. % Ge replacing Si is very efficient in scattering phonons shorter than 1 nm, resulting in a further thermal conductivity reduction by a factor of 2, thereby leading to a thermoelectric figure of merit 0.95 for Si95Ge5, similar to that of large grained Si80Ge20 alloys.en
dc.description.sponsorshipNational Science Foundationen
dc.description.sponsorshipDepartment of Energyen
dc.language.isoen_US
dc.publisherAmerican Physical Societyen
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.102.196803en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceAPSen
dc.titleIncreased Phonon Scattering by Nanograins and Point Defects in Nanostructured Silicon with a Low Concentration of Germaniumen
dc.typeArticleen
dc.identifier.citationZhu, G. H. et al. “Increased Phonon Scattering by Nanograins and Point Defects in Nanostructured Silicon with a Low Concentration of Germanium.” Physical Review Letters 102.19 (2009): 196803. (C) 2010 The American Physical Society.en
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.approverDresselhaus, Mildred
dc.contributor.mitauthorDresselhaus, Mildred
dc.contributor.mitauthorLee, H.
dc.contributor.mitauthorChen, Gang
dc.relation.journalPhysical Review Lettersen
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
eprint.grantNumberCMMI 0833084en
eprint.grantNumberNIRT 0506830en
eprint.grantNumberDE-FG02-08ER46516en
eprint.grantNumberDE-FG02-00ER45805en
dspace.orderedauthorsZhu, G.; Lee, H.; Lan, Y.; Wang, X.; Joshi, G.; Wang, D.; Yang, J.; Vashaee, D.; Guilbert, H.; Pillitteri, A.; Dresselhaus, M.; Chen, G.; Ren, Z.en
dc.identifier.orcidhttps://orcid.org/0000-0001-8492-2261
dc.identifier.orcidhttps://orcid.org/0000-0002-3968-8530
mit.licensePUBLISHER_POLICYen
mit.metadata.statusComplete


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