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dc.contributor.authorDresselhaus, Mildred
dc.contributor.authorJorio, A.
dc.contributor.authorSaito, R.
dc.contributor.authorSato, K.
dc.contributor.authorAraujo, Paulo Antonio Trinidade
dc.date.accessioned2010-02-12T19:59:44Z
dc.date.available2010-02-12T19:59:44Z
dc.date.issued2009-09
dc.date.submitted2009-04
dc.identifier.issn0031-9007
dc.identifier.urihttp://hdl.handle.net/1721.1/51761
dc.description.abstractThe measured optical transition energies Eii of single-wall carbon nanotubes are compared with bright exciton energy calculations. The Eii differences between experiment and theory are minimized by considering a diameter-dependent dielectric constant κ, which comprises the screening from the tube and from the environment. Different κ dependencies are obtained for (E[subscript 11]S, E[subscript 22]S, E[subscript 11]M) relative to (E[subscript 33]S, E[subscript 44]S). A changing environment changes the κ diameter dependence for (E[subscript 11]S, E[subscript 22]S, E[subscript 11]M), but for (E[subscript 33]S, E[subscript 44]S) the environmental effects are minimal. The resulting calculated exciton energies reproduce experimental Eii values within ±70  meV for a diameter range (0.7<dt<3.8  nm) and 1.2<Eii<2.7  eV, thus providing a theoretical justification for Eii, environmental effects and important insights on the dielectric screening in one-dimensional structures.en
dc.language.isoen_US
dc.publisherAmerican Physical Societyen
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.103.146802en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceAPSen
dc.titleDiameter Dependence of the Dielectric Constant for the Excitonic Transition Energy of Single-Wall Carbon Nanotubesen
dc.typeArticleen
dc.identifier.citationAraujo, P. T. et al. “Diameter Dependence of the Dielectric Constant for the Excitonic Transition Energy of Single-Wall Carbon Nanotubes.” Physical Review Letters 103.14 (2009): 146802. © 2009 The American Physical Society.en
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.approverDresselhaus, Mildred
dc.contributor.mitauthorDresselhaus, Mildred
dc.relation.journalPhysical Review Lettersen
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
dspace.orderedauthorsAraujo, P.; Jorio, A.; Dresselhaus, M.; Sato, K.; Saito, R.en
dc.identifier.orcidhttps://orcid.org/0000-0001-8492-2261
mit.licensePUBLISHER_POLICYen
mit.metadata.statusComplete


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