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dc.contributor.authorSakuma, Tai
dc.contributor.authorMiller, M. L.
dc.contributor.authorMillane, Julie M.
dc.contributor.authorKocoloski, Adam Philip
dc.contributor.authorJones, Christopher LaDon
dc.contributor.authorBalewski, Jan T.
dc.contributor.authorSurrow, Bernd
dc.contributor.authorHoffman, Alan Michael
dc.date.accessioned2010-03-01T18:25:15Z
dc.date.available2010-03-01T18:25:15Z
dc.date.issued2009-02
dc.date.submitted2008-07
dc.identifier.issn0556-2813
dc.identifier.urihttp://hdl.handle.net/1721.1/51857
dc.description.abstractWe present measurements of net charge fluctuations in Au+Au collisions at √[subscript s[superscript [NN]]=19.6, 62.4, 130, and 200 GeV, Cu+Cu collisions at √[subscript s[superscript [NN]]=62.4 and 200 GeV, and p+p collisions at √s=200 GeV using the dynamical net charge fluctuations measure ν[subscript +-,dyn]. We observe that the dynamical fluctuations are nonzero at all energies and exhibit a modest dependence on beam energy. A weak system size dependence is also observed. We examine the collision centrality dependence of the net charge fluctuations and find that dynamical net charge fluctuations violate 1/N[subscript ch] scaling but display approximate 1/N[subscript part] scaling. We also study the azimuthal and rapidity dependence of the net charge correlation strength and observe strong dependence on the azimuthal angular range and pseudorapidity widths integrated to measure the correlation.en
dc.description.sponsorshipKorea Science and Engineering Foundationen
dc.description.sponsorshipPolish State Committee for Scientific Researchen
dc.description.sponsorshipSwiss National Science Foundationen
dc.description.sponsorshipCSIR of the Government of Indiaen
dc.description.sponsorshipDST of the Government of Indiaen
dc.description.sponsorshipDAE of the Government of Indiaen
dc.description.sponsorshipFOM of the Netherlandsen
dc.description.sponsorshipGA of the Czech Republicen
dc.description.sponsorshipIRP of the Czech Republicen
dc.description.sponsorshipMoE of Chinaen
dc.description.sponsorshipMoST of Chinaen
dc.description.sponsorshipCAS of Chinaen
dc.description.sponsorshipNNSFC of Chinaen
dc.description.sponsorshipRussian Ministry of Science and Technologyen
dc.description.sponsorshipFAPESP of Brazilen
dc.description.sponsorshipEPSRC of the United Kingdomen
dc.description.sponsorshipSTFC of the United Kingdomen
dc.description.sponsorshipEMN of Franceen
dc.description.sponsorshipRPL of Franceen
dc.description.sponsorshipRA of Franceen
dc.description.sponsorshipCNRS/IN2P3 of Franceen
dc.description.sponsorshipDFG Excellence Cluster EXC153 of Germanyen
dc.description.sponsorshipAlfred P. Sloan Foundationen
dc.description.sponsorshipNational Science Foundationen
dc.description.sponsorshipDepartment of Energyen
dc.description.sponsorshipOffice of High Energy Physicsen
dc.description.sponsorshipOffice of Nuclear Physicsen
dc.language.isoen_US
dc.publisherAmerican Physical Societyen
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevC.79.024906en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceAPSen
dc.titleBeam-energy and system-size dependence of dynamical net charge fluctuationsen
dc.typeArticleen
dc.identifier.citationSTAR Collaboration et al. “Beam-energy and system-size dependence of dynamical net charge fluctuations.” Physical Review C 79.2 (2009): 024906. © 2009 The American Physical Societyen
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Scienceen_US
dc.contributor.approverSurrow, Bernd
dc.contributor.mitauthorSakuma, Tai
dc.contributor.mitauthorMiller, M. L.
dc.contributor.mitauthorMillane, Julie M.
dc.contributor.mitauthorKocoloski, Adam Philip
dc.contributor.mitauthorJones, Christopher LaDon
dc.contributor.mitauthorHoffman, A. M.
dc.contributor.mitauthorBalewski, Jan T.
dc.contributor.mitauthorSurrow, Bernd
dc.relation.journalPhysical Review Cen
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
dspace.orderedauthorsAbelev, B.; Aggarwal, M.; Ahammed, Z.; Anderson, B.; Arkhipkin, D.; Averichev, G.; Bai, Y.; Balewski, J.; Barannikova, O.; Barnby, L.; Baudot, J.; Baumgart, S.; Beavis, D.; Bellwied, R.; Benedosso, F.; Betts, R.; Bhardwaj, S.; Bhasin, A.; Bhati, A.; Bichsel, H.; Bielcik, J.; Bielcikova, J.; Biritz, B.; Bland, L.; Bombara, M.; Bonner, B.; Botje, M.; Bouchet, J.; Braidot, E.; Brandin, A.; Bueltmann, S.; Burton, T.; Bystersky, M.; Cai, X.; Caines, H.; Sánchez, M.; Callner, J.; Catu, O.; Cebra, D.; Cendejas, R.; Cervantes, M.; Chajecki, Z.; Chaloupka, P.; Chattopadhyay, S.; Chen, H.; Chen, J.; Chen, J.; Cheng, J.; Cherney, M.; Chikanian, A.; Choi, K.; Christie, W.; Chung, S.; Clarke, R.; Codrington, M.; Coffin, J.; Cormier, T.; Cosentino, M.; Cramer, J.; Crawford, H.; Das, D.; Dash, S.; Daugherity, M.; de Moira, M.; Dedovich, T.; DePhillips, M.; Derevschikov, A.; de Souza, R.; Didenko, L.; Dictel, T.; Djawotho, P.; Dogra, S.; Dong, X.; Drachenberg, J.; Draper, J.; Du, F.; Dunlop, J.; Mazumdar, M.; Edwards, W.; Efimov, L.; Elhalhuli, E.; Elnimr, M.; Emelianov, V.; Engelage, J.; Eppley, G.; Erazmus, B.; Estienne, M.; Eun, L.; Fachini, P.; Fatemi, R.; Fedorisin, J.; Feng, A.; Filip, P.; Finch, E.; Fine, V.; Fisyak, Y.; Gagliardi, C.; Gaillard, L.; Gangadharan, D.; Ganti, M.; Garcia-Solis, E.; Ghazikhanian, V.; Ghosh, P.; Gorbunov, Y.; Gordon, A.; Grebenyuk, O.; Grosnick, D.; Grube, B.; Guertin, S.; Guimaraes, K.; Gupta, A.; Gupta, N.; Guryn, W.; Hallman, T.; Hamed, A.; Harris, J.; He, W.; Heinz, M.; Heppelmann, S.; Hippolyte, B.; Hirsch, A.; Hjort, E.; Hoffman, A.; Hoffmann, G.; Hofman, D.; Hollis, R.; Huang, H.; Humanic, T.; Huo, L.; Igo, G.; Iordanova, A.; Jacobs, P.; Jacobs, W.; Jakl, P.; Jena, C.; Jin, F.; Jones, C.; Jones, P.; Joseph, J.; Judd, E.; Kabana, S.; Kajimoto, K.; Kang, K.; Kapitan, J.; Kaplan, M.; Keane, D.; Kechechyan, A.; Kettler, D.; Khodyrev, V.; Kiryluk, J.; Kisiel, A.; Klein, S.; Knospe, A.; Kocoloski, A.; Koetke, D.; Kopytine, M.; Kotchenda, L.; Kouchpil, V.; Kravtsov, P.; Kravtsov, V.; Krueger, K.; Kuhn, C.; Kumar, A.; Kumar, L.; Kurnadi, P.; Lamont, M.; Landgraf, J.; LaPointe, S.; Laue, F.; Lauret, J.; Lebedev, A.; Lednicky, R.; Lee, C.-H.; LeVine, M.; Li, C.; Li, Y.; Lin, G.; Lin, X.; Lindenbaum, S.; Lisa, M.; Liu, F.; Liu, J.; Liu, L.; Ljubicic, T.; Llope, W.; Longacre, R.; Lu, Y.; Ludlam, T.; Lynn, D.; Ma, G.; Ma, J.; Ma, Y.; Mahapatra, D.; Majka, R.; Mangotra, L.; Manweiler, R.; Margetis, S.; Markert, C.; Matis, H.; Matulenko, Yu.; McShane, T.; Meschanin, A.; Millane, J.; Miller, M.; Minaev, N.; Mioduszewski, S.; Mischke, A.; Mitchell, J.; Mohanty, B.; Morozov, D.; Munhoz, M.; Nandi, B.; Nattrass, C.; Nayak, T.; Nelson, J.; Nepali, C.; Netrakanti, P.; Ng, M.; Nogach, L.; Nurushev, S.; Odyniec, G.; Ogawa, A.; Okada, H.; Okorokov, V.; Olson, D.; Pachr, M.; Pal, S.; Panebratsev, Y.; Pawlak, T.; Peitzmann, T.; Perevoztchikov, V.; Perkins, C.; Peryt, W.; Phatak, S.; Planinic, M.; Pluta, J.; Poljak, N.; Porile, N.; Poskanzer, A.; Potekhin, M.; Potukuchi, B.; Prindle, D.; Pruneau, C.; Pruthi, N.; Putschke, J.; Raniwala, R.; Raniwala, S.; Ray, R.; Ridiger, A.; Ritter, H.; Roberts, J.; Rogachevskiy, O.; Romero, J.; Rose, A.; Roy, C.; Ruan, L.; Russcher, M.; Rykov, V.; Sahoo, R.; Sakrejda, I.; Sakuma, T.; Salur, S.; Sandweiss, J.; Sarsour, M.; Schambach, J.; Scharenberg, R.; Schmitz, N.; Seger, J.; Selyuzhenkov, I.; Seyboth, P.; Shabetai, A.; Shahaliev, E.; Shao, M.; Sharma, M.; Shi, S.; Shi, X.-H.; Sichtermann, E.; Simon, F.; Singaraju, R.; Skoby, M.; Smirnov, N.; Snellings, R.; Sorensen, P.; Sowinski, J.; Spinka, H.; Srivastava, B.; Stadnik, A.; Stanislaus, T.; Staszak, D.; Strikhanov, M.; Stringfellow, B.; Suaide, A.; Suarez, M.; Subba, N.; Sumbera, M.; Sun, X.; Sun, Y.; Sun, Z.; Surrow, B.; Symons, T.; de Toledo, A.; Takahashi, J.; Tang, A.; Tang, Z.; Tarnowsky, T.; Thein, D.; Thomas, J.; Tian, J.; Timmins, A.; Timoshenko, S.; Tokarev, M.; Tram, V.; Trattner, A.; Trentalange, S.; Tribble, R.; Tsai, O.; Ulery, J.; Ullrich, T.; Underwood, D.; Buren, G.; van der Kolk, N.; van Leeuwen, M.; Molen, A.; Varma, R.; Vasconcelos, G.; Vasilevski, I.; Vasiliev, A.; Videbaek, F.; Vigdor, S.; Viyogi, Y.; Vokal, S.; Voloshin, S.; Wada, M.; Waggoner, W.; Wang, F.; Wang, G.; Wang, J.; Wang, Q.; Wang, X.; Wang, X.; Wang, Y.; Webb, J.; Westfall, G.; Whitten, C.; Wieman, H.; Wissink, S.; Witt, R.; Wu, J.; Wu, Y.; Xu, N.; Xu, Q.; Xu, Y.; Xu, Z.; Yepes, P.; Yoo, I.-K.; Yue, Q.; Zawisza, M.; Zbroszczyk, H.; Zhan, W.; Zhang, H.; Zhang, S.; Zhang, W.; Zhang, Y.; Zhang, Z.; Zhao, Y.; Zhong, C.; Zhou, J.; Zoulkarneev, R.; Zoulkarneeva, Y.; Zuo, J.en
dc.identifier.orcidhttps://orcid.org/0000-0001-5839-707X
mit.licensePUBLISHER_POLICYen
mit.metadata.statusComplete


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