Show simple item record

dc.contributor.authorFletcher, Alyson K.
dc.contributor.authorGoyal, Vivek K.
dc.contributor.authorRangan, Sundeep
dc.date.accessioned2010-03-10T20:33:17Z
dc.date.available2010-03-10T20:33:17Z
dc.date.issued2009-11
dc.date.submitted2009-02
dc.identifier.issn0018-9448
dc.identifier.urihttp://hdl.handle.net/1721.1/52487
dc.description.abstracthe paper considers the problem of detecting the sparsity pattern of a k -sparse vector in BBR n from m random noisy measurements. A new necessary condition on the number of measurements for asymptotically reliable detection with maximum-likelihood (ML) estimation and Gaussian measurement matrices is derived. This necessary condition for ML detection is compared against a sufficient condition for simple maximum correlation (MC) or thresholding algorithms. The analysis shows that the gap between thresholding and ML can be described by a simple expression in terms of the total signal-to-noise ratio (SNR), with the gap growing with increasing SNR. Thresholding is also compared against the more sophisticated Lasso and orthogonal matching pursuit (OMP) methods. At high SNRs, it is shown that the gap between Lasso and OMP over thresholding is described by the range of powers of the nonzero component values of the unknown signals. Specifically, the key benefit of Lasso and OMP over thresholding is the ability of Lasso and OMP to detect signals with relatively small components.en
dc.description.sponsorshipCentre Bernoulli at École Polytechnique Fédérale de Lausanneen
dc.description.sponsorshipNational Science Foundation (CAREER Grant CCF-643836)en
dc.description.sponsorshipUniversity of California President’s Postdoctoral Fellowshipen
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen
dc.relation.isversionofhttp://dx.doi.org/10.1109/tit.2009.2032726en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceIEEEen
dc.titleNecessary and Sufficient Conditions for Sparsity Pattern Recoveryen
dc.typeArticleen
dc.identifier.citationFletcher, A.K., S. Rangan, and V.K. Goyal. “Necessary and Sufficient Conditions for Sparsity Pattern Recovery.” Information Theory, IEEE Transactions on 55.12 (2009): 5758-5772. © 2009 IEEEen
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverGoyal, Vivek K.
dc.contributor.mitauthorFletcher, Alyson K.
dc.contributor.mitauthorGoyal, Vivek K.
dc.relation.journalIEEE Transactions on Information Theoryen
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
dspace.orderedauthorsFletcher, Alyson K.; Rangan, Sundeep; Goyal, Vivek Ken
mit.licensePUBLISHER_POLICYen
mit.metadata.statusComplete


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record