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In silico estimates of cell electroporation by electrical incapacitation waveforms

Author(s)
Weaver, James C.; Burns, Stephen K.; Smith, Kyle Christopher; Esser, Axel Thomas; Gowrishankar, Thiruvallur R.
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Abstract
We use a system model of a cell and approximate magnitudes of electrical incapacitation (EI) device waveforms to estimate conditions that lead to responses with or without electroporation (EP) of cell membranes near electrodes. Single pulse waveforms of Taser X26 and Aegis MK63 devices were measured using a resistive load. For the present estimates the digitized waveforms were scaled in magnitude according to the inverse square radial distance from two tissue-penetrating electrodes, approximated as hemispheres. The corresponding tissue level electric fields were then used as inputs to the cell system model. A dynamic pore model for membrane electroporation (EP) was assigned to many different sites on the cell plasma membrane (PM). EI devices generate sufficiently large transmembrane voltage, U[subscript m](t), such that pores were created, evolving into a heterogeneous and time-dependent pore population. These approximate responses suggest that both waveforms can cause PM EP. Peripheral nerve damage by EP is a candidate side effect. More extensive EP is expected from the Taser X26 than the Aegis MK63, mainly due to the approximately eight-fold difference in the peak magnitudes. In silico examination of EI waveforms by multiscale modeling is warranted, and can involve whole body, tissue and cell level models that now exist and are rapidly being improved.
Date issued
2009-11
URI
http://hdl.handle.net/1721.1/52601
Department
Harvard University--MIT Division of Health Sciences and Technology
Journal
2009 Engineering in Medicine and Biology Society
Publisher
Institute of Electrical and Electronics Engineers
Citation
Gowrishankar, T.R. et al. “In silico estimates of cell electroporation by electrical incapacitation waveforms.” Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE. 2009. 6505-6508. © 2009 IEEE
Version: Final published version
ISBN
978-1-4244-3296-7
ISSN
1557-170X

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