| dc.contributor.author | Pezeril, T. | |
| dc.contributor.author | Nelson, Keith Adam | |
| dc.contributor.author | Klieber, Christoph | |
| dc.contributor.author | Andrieu, S. | |
| dc.contributor.author | Chateigner, D. | |
| dc.date.accessioned | 2010-03-16T19:32:38Z | |
| dc.date.available | 2010-03-16T19:32:38Z | |
| dc.date.issued | 2009-02 | |
| dc.date.submitted | 2009-01 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.other | SPIE CID: 721408-9 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/52630 | |
| dc.description.abstract | We will review recent progress on the generation and detection of picosecond shear acoustic waves. Examples will be shown in which the transverse isotropic symmetry of the sample structure is broken in order to permit shear wave generation through sudden laser heating. As an illustration of the technique, picosecond longitudinal and shear acoustic waves have been successfully employed to probe structural dynamics in nano-sized solids (gold nano-crystals assemblies) and nano-sized liquids (glycerol and water). | en |
| dc.description.sponsorship | National Science Foundation (Grants No. CHE-0616939 and DMR-0414895) | en |
| dc.description.sponsorship | CNRS | en |
| dc.description.sponsorship | Department of Energy (Grant No. DE-FG02-00ER15087) | en |
| dc.language.iso | en_US | |
| dc.publisher | Society of Photo-Optical Instrumentation Engineers | en |
| dc.relation.isversionof | http://dx.doi.org/10.1117/12.808221 | en |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en |
| dc.source | SPIE | en |
| dc.title | Picosecond shear waves in nano-sized solids and liquids | en |
| dc.type | Article | en |
| dc.identifier.citation | Pezeril, T. et al. “Picosecond shear waves in nano-sized solids and liquids.” Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIII. Ed. Kong-Thon Tsen et al. San Jose, CA, USA: SPIE, 2009. 721408-9. © 2009 SPIE | en |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Chemistry | en_US |
| dc.contributor.approver | Nelson, Keith Adam | |
| dc.contributor.mitauthor | Nelson, Keith Adam | |
| dc.contributor.mitauthor | Klieber, Christoph | |
| dc.relation.journal | Proceedings of SPIE--the International Society for Optical Engineering | en |
| dc.eprint.version | Final published version | en |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en |
| dspace.orderedauthors | Pezeril, T.; Klieber, C.; Andrieu, S.; Chateigner, D.; Nelson, K. A. | en |
| dc.identifier.orcid | https://orcid.org/0000-0001-7804-5418 | |
| mit.license | PUBLISHER_POLICY | en |
| mit.metadata.status | Complete | |
