Show simple item record

dc.contributor.authorWarger, William C., II
dc.contributor.authorGuerrera, Stephen
dc.contributor.authorEastman, Zachary
dc.contributor.authorDiMarzio, Charles A.
dc.date.accessioned2010-03-17T18:12:36Z
dc.date.available2010-03-17T18:12:36Z
dc.date.issued2009-03
dc.date.submitted2009-01
dc.identifier.issn0277-786X
dc.identifier.otherSPIE CID: 71840M-11
dc.identifier.urihttp://hdl.handle.net/1721.1/52677
dc.description.abstractConfocal microscopes achieve high spatial resolution by focusing both a light source and a detector to a single point with an objective having a high numerical aperture. In order to produce an image, it is then necessary to scan this common focal spot through the specimen, and it is often important to image the full field of view in a short time. In order to avoid vignetting, the scanning must be done in or near the pupil of the optical system. For some fast scanners, this requires the use of multiple relay telescopes to create multiple pupils. Galvanometric scanners impose a practical limit on the scan speed because of the angular accelerations involved in reversing direction. Rotating polygons are often used to achieve greater speed. For a scanner consisting of a rotating polygon and a galvanometric scanner, two relay telescopes are normally used. We have developed a dual-wedge scanner which has the potential to perform the scan in a configuration which is very short in the axial direction, thereby eliminating much of the complexity of current high-speed scanners. We have demonstrated a prototype of the scanner in a reflectance confocal microscope. Transverse and axial resolution are comparable to those of other scanning systems. The selection of rotation speeds for the wedges is important to ensuring full coverage of the field of view in a reasonable time. Various tradeoffs on these parameters will be discussed. The beam behavior in the pupil will be discussed. Resolution limits and aberrations will be shown from ray-tracing analysis, and compared to experimental results.en
dc.description.sponsorshipCenter for Subsurface Sensing and Imaging Systems (National Science Foundation award number EEC- 9986821)en
dc.description.sponsorshipNational Cancer Institute of the National Institutes of Health (award number 1R41CA117187-01)en
dc.language.isoen_US
dc.publisherSociety of Photo-optical Instrumentation Engineersen
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.810527en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceSPIEen
dc.titleEfficient Confocal Microscopy with a Dual-Wedge Scanneren
dc.typeArticleen
dc.identifier.citationWarger II, William C. et al. “Efficient confocal microscopy with a dual-wedge scanner.” Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVI. Ed. Jose-Angel Conchello, Carol J. Cogswell, & Tony Wilson. San Jose, CA, USA: SPIE, 2009. 71840M-11. © 2009 SPIEen
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverGuerrera, Stephen
dc.contributor.mitauthorGuerrera, Stephen
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineeringen
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
dspace.orderedauthorsWarger II, William C.; Guerrera, Stephen A.; Eastman, Zachary; DiMarzio, Charles A.en
dc.identifier.orcidhttps://orcid.org/0000-0003-3946-2862
mit.licensePUBLISHER_POLICYen
mit.metadata.statusComplete


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record