| dc.contributor.author | Deng, D. S. | |
| dc.contributor.author | Orf, Nicholas D. | |
| dc.contributor.author | Abouraddy, Ayman F. | |
| dc.contributor.author | Fink, Yoel | |
| dc.date.accessioned | 2010-03-18T18:07:16Z | |
| dc.date.available | 2010-03-18T18:07:16Z | |
| dc.date.issued | 2009-08 | |
| dc.date.submitted | 2009-08 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.other | SPIE CID: 740204-3 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/52712 | |
| dc.description.abstract | One dimensional nanostructure such as nanowires is typically fabricated by the wafer-based approach. Here we report nanowires are fabricated by thermal drawing of fiber. A thin viscous semiconductor film internal to the fiber undergoes filamentation driven by a fluid instability while retaining longitudinal structural integrity. Arrays of centimeter-long crystalline nanowires by post-drawing crystallization process are electrically contacted and yield a two-order-of-magnitude change in conductivity between dark and illuminated states. These results hold promise for the nanowire-detector arrays that may be integrated with large-area electronics. | en |
| dc.language.iso | en_US | |
| dc.publisher | Society of Photo-optical Instrumentation Engineers | en |
| dc.relation.isversionof | http://dx.doi.org/10.1117/12.827379 | en |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en |
| dc.source | SPIE | en |
| dc.title | Novel fabrication and optoelectronic property of semiconductor filaments by optical-fiber thermal drawing | en |
| dc.type | Article | en |
| dc.identifier.citation | Deng, D. S. et al. “Novel fabrication and optoelectronic property of semiconductor filaments by optical-fiber thermal drawing.” Nanoengineering: Fabrication, Properties, Optics, and Devices VI. Ed. Elizabeth A. Dobisz & Louay A. Eldada. San Diego, CA, USA: SPIE, 2009. 740204-3. © 2009 SPIE | en |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | en_US |
| dc.contributor.approver | Fink, Yoel | |
| dc.contributor.mitauthor | Deng, D. S. | |
| dc.contributor.mitauthor | Orf, Nicholas D. | |
| dc.contributor.mitauthor | Abouraddy, Ayman F. | |
| dc.contributor.mitauthor | Fink, Yoel | |
| dc.relation.journal | Proceedings of SPIE--the International Society for Optical Engineering | en |
| dc.eprint.version | Final published version | en |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en |
| dspace.orderedauthors | Deng, D. S.; Orf, N.; Abouraddy, A. F.; Fink, Y. | en |
| dc.identifier.orcid | https://orcid.org/0000-0001-9752-2283 | |
| mit.license | PUBLISHER_POLICY | en |
| mit.metadata.status | Complete | |