Development of a critical-angle transmission grating spectrometer for the International X-Ray Observatory
Author(s)
Smith, Matthew; Schulz, Norbert S.; Schattenburg, Mark Lee; Mukherjee, Pran; Huenemoerder, David P.; Foster, Richard F.; Bautz, Marshall W.; Ahn, Minseung; Marshall, Herman; Heilmann, Ralf K; ... Show more Show less
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We present a high-resolution soft x-ray grating spectrometer concept for the International X-Ray Observatory (IXO) that meets or exceeds the minimum requirements for effective area (> 1, 000 cm[superscript 2] for E < 1 keV) and spectral resolution (E/[open triangle]E > 3, 000). At the heart of the spectrometer is an array of recently developed highefficiency blazed transmission gratings, the so-called critical-angle transmission (CAT) gratings. They combine the advantages of traditional transmission gratings (very low mass, extremely relaxed alignment and flatness tolerances) with those of x-ray reflection gratings (high efficiency due to blazing in the direction of grazing-incidence reflection). In addition, a CAT grating spectrometer is well-suited for co-existence with energy-dispersive highenergy focal plane detectors, since most high-energy x rays are neither absorbed, nor diffracted, and contribute to the effective area at the telescope focus. Since our initial successful x-ray demonstrations of the CAT grating concept with large-period and lower aspect-ratio prototypes, we have now microfabricated 200 nm-period silicon CAT gratings comprised of grating bars with the required dimensions (6 micron tall, 40 nm wide, aspect ratio 150), optimized for the 0.3 to 1.0 keV energy band. Preliminary analysis of recent x-ray tests show blazing behavior up to 1.28 keV in accordance with predictions.
Date issued
2009-08Department
MIT Kavli Institute for Astrophysics and Space ResearchJournal
Proceedings of SPIE
Publisher
The International Society for Optical Engineering
Citation
Heilmann, Ralf K. et al. “Development of a critical-angle transmission grating spectrometer for the International X-Ray Observatory.” Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Ed. Stephen L. O'Dell & Giovanni Pareschi. San Diego, CA, USA: SPIE, 2009. 74370G-12. © 2009 SPIE--The International Society for Optical Engineering
Version: Final published version
ISSN
0277-786X