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dc.contributor.authorSinha, Niraj
dc.contributor.authorMelnik, R. V. N.
dc.contributor.authorPatil, S.
dc.date.accessioned2010-03-19T16:07:50Z
dc.date.available2010-03-19T16:07:50Z
dc.date.issued2009-08
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/52740
dc.description.abstractWe quantify the influence of thermopiezoelectric effects in nano-sized Al[subscript x]Ga[subscript 1-x]N/GaN heterostructures for pressure sensor applications based on the barrier height modulation principle. We use a fully coupled thermoelectromechanical formulation, consisting of balance equations for heat transfer, electrostatics and mechanical field. To estimate the vertical transport current in the heterostructures, we have developed a multi-physics model incorporating thermionic emission, thermionic field emission, and tunneling as the current transport mechanisms. A wide range of thermal (0-300 K) and pressure (0-10 GPa) loadings has been considered. The results for the thermopiezoelectric modulation of the barrier height in these heterostructures have been obtained and optimized. The calculated current shows a linear decrease with increasing pressure. The linearity in pressure response suggests that Al[subscript x]Ga[subscript 1-x]N/GaN heterostructure-based devices are promising candidates for pressure sensor applications under severe environmental conditions.en
dc.language.isoen_US
dc.publisherThe International Society for Optical Engineeringen
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.826267en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceSPIEen
dc.titleModeling of GaN/AlN heterostructure-based nano pressure sensorsen
dc.typeArticleen
dc.identifier.citationPatil, S., N. Sinha, and R. V. N. Melnik. “Modeling of GaN/AlN heterostructure-based nano pressure sensors.” Nanoengineering: Fabrication, Properties, Optics, and Devices VI. Ed. Elizabeth A. Dobisz & Louay A. Eldada. San Diego, CA, USA: SPIE, 2009. 74020C-8. © 2009 SPIE--The International Society for Optical Engineeringen
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.approverSinha, Niraj
dc.contributor.mitauthorSinha, Niraj
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineering; v.7402en
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
dspace.orderedauthorsPatil, S.; Sinha, N.; Melnik, R. V. N.en
mit.licensePUBLISHER_POLICYen
mit.metadata.statusComplete


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