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dc.contributor.authorBecla, Piotr
dc.contributor.authorFeng, Zhe Chuan
dc.contributor.authorTien, Der-Chi
dc.contributor.authorYang, Yu-Chang
dc.contributor.authorHou, Fu-Chung
dc.contributor.authorShih, Yen-Hao
dc.contributor.authorJhang, Sheng-Hong
dc.contributor.authorYang, Tzuen-Rong
dc.date.accessioned2010-03-19T16:22:44Z
dc.date.available2010-03-19T16:22:44Z
dc.date.issued2009-09
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/52741
dc.description.abstractFar-infrared (FIR) reflectance spectroscopy has been employed to study the optical properties for a series of bulk CdZnxTe1-x and CdSexTe1-x wafers. The zone-centre optical phonons for the ternary alloys show a variety of behavior patterns: they exhibit a "one-mode", "two-mode" or "intermediate-mode" behavior depending on the vibration characteristics of the end binary members. The CdSeTe called CST were found to be single-crystal with the zincblende structure. These four samples labeled with CST5, CST15, CST25, and CST35, which correspond with the composition of Se, 5%, 15%, 25%, 35%, respectively. The intensity of CdTe-like TO band decays with x increasing, and the peak position increases from 140 cm[superscript -1] to 145 cm[superscript -1]. In the other hand, the intensity of CdSe-like TO band grows with x increasing, and the peak position of CdSe-like TO band increases from 174 cm[superscript -1] to 181 cm[superscript -1]. We use the model of dielectric function and using Least-Square fit to find the optical and transport parameters. By the infrared spectra analysis, we found the conductivity of CdZn[subscript x]Te[subscript 1-x] increase with increasing of x value and the conductivity of CdZn[subscript x]Te[subscript 1-x] decrease with increasing of x value.en
dc.language.isoen_US
dc.publisherThe International Society for Optical Engineeringen
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.825874en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceSPIEen
dc.titleFar-IR reflectance spectra analysis of CdZnTe and related materialsen
dc.typeArticleen
dc.identifier.citationYang, Tzuen-Rong et al. “Far-IR reflectance spectra analysis of CdZnTe and related materials.” Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. Ed. Ralph B. James, Larry A. Franks, & Arnold Burger. San Diego, CA, USA: SPIE, 2009. 74490L-9. © 2009 SPIE--The International Society for Optical Engineeringen
dc.contributor.departmentMIT Materials Research Laboratoryen_US
dc.contributor.departmentFrancis Bitter Magnet Laboratory (Massachusetts Institute of Technology)en_US
dc.contributor.approverBecla, Piotr
dc.contributor.mitauthorBecla, Piotr
dc.relation.journalProceedings of SPIEen
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
dspace.orderedauthorsYang, Tzuen-Rong; Jhang, Sheng-Hong; Shih, Yen-Hao; Hou, Fu-Chung; Yang, Yu-Chang; Becla, P.; Tien, Der-Chi; Feng, Zhe Chuanen
dc.identifier.orcidhttps://orcid.org/0000-0002-0769-0652
mit.licensePUBLISHER_POLICYen


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