| dc.contributor.author | Becla, Piotr | |
| dc.contributor.author | Feng, Zhe Chuan | |
| dc.contributor.author | Tien, Der-Chi | |
| dc.contributor.author | Yang, Yu-Chang | |
| dc.contributor.author | Hou, Fu-Chung | |
| dc.contributor.author | Shih, Yen-Hao | |
| dc.contributor.author | Jhang, Sheng-Hong | |
| dc.contributor.author | Yang, Tzuen-Rong | |
| dc.date.accessioned | 2010-03-19T16:22:44Z | |
| dc.date.available | 2010-03-19T16:22:44Z | |
| dc.date.issued | 2009-09 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/52741 | |
| dc.description.abstract | Far-infrared (FIR) reflectance spectroscopy has been employed to study the optical properties for a series of bulk CdZnxTe1-x and CdSexTe1-x wafers. The zone-centre optical phonons for the ternary alloys show a variety of behavior patterns: they exhibit a "one-mode", "two-mode" or "intermediate-mode" behavior depending on the vibration characteristics of the end binary members. The CdSeTe called CST were found to be single-crystal with the zincblende structure. These four samples labeled with CST5, CST15, CST25, and CST35, which correspond with the composition of Se, 5%, 15%, 25%, 35%, respectively. The intensity of CdTe-like TO band decays with x increasing, and the peak position increases from 140 cm[superscript -1] to 145 cm[superscript -1]. In the other hand, the intensity of CdSe-like TO band grows with x increasing, and the peak position of CdSe-like TO band increases from 174 cm[superscript -1] to 181 cm[superscript -1]. We use the model of dielectric function and using Least-Square fit to find the optical and transport parameters. By the infrared spectra analysis, we found the conductivity of CdZn[subscript x]Te[subscript 1-x] increase with increasing of x value and the conductivity of CdZn[subscript x]Te[subscript 1-x] decrease with increasing of x value. | en |
| dc.language.iso | en_US | |
| dc.publisher | The International Society for Optical Engineering | en |
| dc.relation.isversionof | http://dx.doi.org/10.1117/12.825874 | en |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en |
| dc.source | SPIE | en |
| dc.title | Far-IR reflectance spectra analysis of CdZnTe and related materials | en |
| dc.type | Article | en |
| dc.identifier.citation | Yang, Tzuen-Rong et al. “Far-IR reflectance spectra analysis of CdZnTe and related materials.” Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. Ed. Ralph B. James, Larry A. Franks, & Arnold Burger. San Diego, CA, USA: SPIE, 2009. 74490L-9. © 2009 SPIE--The International Society for Optical Engineering | en |
| dc.contributor.department | MIT Materials Research Laboratory | en_US |
| dc.contributor.department | Francis Bitter Magnet Laboratory (Massachusetts Institute of Technology) | en_US |
| dc.contributor.approver | Becla, Piotr | |
| dc.contributor.mitauthor | Becla, Piotr | |
| dc.relation.journal | Proceedings of SPIE | en |
| dc.eprint.version | Final published version | en |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en |
| dspace.orderedauthors | Yang, Tzuen-Rong; Jhang, Sheng-Hong; Shih, Yen-Hao; Hou, Fu-Chung; Yang, Yu-Chang; Becla, P.; Tien, Der-Chi; Feng, Zhe Chuan | en |
| dc.identifier.orcid | https://orcid.org/0000-0002-0769-0652 | |
| mit.license | PUBLISHER_POLICY | en |
| mit.metadata.status | Complete | |