Observation of nonequilibrium carrier distribution in Ge, Si, and GaAs by terahertz pump-terahertz probe measurements
Author(s)
Hebling, Janos; Hoffmann, Matthias C.; Hwang, Harold Young; Yeh, Ka-Lo; Nelson, Keith Adam
DownloadHebling-2010-Observation of nonequilibrium carrier distribution in Ge, Si, and GaAs by terahertz pump-terahertz probe measurements.pdf (284.9Kb)
PUBLISHER_POLICY
Publisher Policy
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Terms of use
Metadata
Show full item recordAbstract
We compare the observed strong saturation of the free-carrier absorption in n-type semiconductors at 300 K in the terahertz (THz) frequency range when single-cycle pulses with intensities up to 150 MW/cm[superscript 2] are used. In the case of germanium, a small increase in the absorption occurs at intermediate THz pulse energies. The recovery of the free-carrier absorption was monitored by time-resolved THz pump–THz probe measurements. At short probe delay times, the frequency response of germanium cannot be fitted by the Drude model. We attribute these unique phenomena of Ge to dynamical overpopulation of the high mobility Γ conduction-band valley.
Date issued
2010-01Department
Massachusetts Institute of Technology. Department of ChemistryJournal
Physical Review B
Publisher
American Physical Society
Citation
Hebling, Janos et al. “Observation of nonequilibrium carrier distribution in Ge, Si, and GaAs by terahertz pump terahertz probe measurements.” Physical Review B 81.3 (2010): 035201. © 2010 The American Physical Society
Version: Final published version
ISSN
1098-0121
1550-235X