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Multiple-quantum 2D spectroscopy of many-body correlations in GaAs quantum wells

dc.contributor.authorNelson, Keith Adam
dc.contributor.authorArias, Dylan H.
dc.contributor.authorWen, Patrick
dc.contributor.authorStone, Katherine Walowicz
dc.contributor.authorTurner, Daniel B.
dc.date.accessioned2010-09-16T19:29:37Z
dc.date.available2010-09-16T19:29:37Z
dc.date.issued2010-03
dc.date.submitted2010-01
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/58571
dc.description.abstractMultiple-quantum two-dimensional Fourier transform optical (2D FTOPT) spectroscopy was developed and conducted on GaAs quantum wells. Spatiotemporal femtosecond pulse shaping was used to control the optical phases and time delays of ultrashort pulses in multiple non-collinear beams so that fully coherent four-wave and higher-order mixing measurements could be conducted without delay stages, multiple interferometers, or any active phase control. Coherences of biexcitons, unbound but correlated exciton pairs, and excitons undergoing rephasing were observed directly.en_US
dc.description.sponsorshipNational Defense Science and Engineering Graduate Fellowshipen_US
dc.description.sponsorshipNational Science Foundationen_US
dc.description.sponsorshipUnited States. Dept. of Energy (BES-EFRC award DE-SC0001088)en_US
dc.description.sponsorshipNational Science Foundation (grant CHE-0616939)en_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.843632en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleMultiple-quantum 2D spectroscopy of many-body correlations in GaAs quantum wellsen_US
dc.typeArticleen_US
dc.identifier.citationTurner, Daniel B. et al. “Multiple-quantum 2D spectroscopy of many-body correlations in GaAs quantum wells.” Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIV. Ed. Jin-Joo Song et al. San Francisco, California, USA: SPIE, 2010. 76001J-6. ©2010 SPIE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverNelson, Keith Adam
dc.contributor.mitauthorNelson, Keith Adam
dc.contributor.mitauthorArias, Dylan H.
dc.contributor.mitauthorWen, Patrick
dc.contributor.mitauthorStone, Katherine Walowicz
dc.contributor.mitauthorTurner, Daniel B.
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineering ; v. 7600en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsTurner, Daniel B.; Stone, Katherine W.; Wen, Patrick; Arias, Dylan H.; Nelson, Keith A.en
dc.identifier.orcidhttps://orcid.org/0000-0003-2358-6967
dc.identifier.orcidhttps://orcid.org/0000-0001-7804-5418
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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